About: Detection of Backscattered Electrons in Environmental Scaning Electron Microscope

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Impact of primary electrons causes generation of signals in the environmental scanning electron microscope (ESEM). These signals can be subsequently detected. Secondary and the backscattered electrons are very often used to obtein information about the specimen. In ESEM secondary electrons are mostly detected by a scintillation detector. Impact of primary electrons causes generation of signals in the environmental scanning electron microscope (ESEM). These signals can be subsequently detected. Secondary and the backscattered electrons are very often used to obtein information about the specimen. In ESEM secondary electrons are mostly detected by a scintillation detector. (en)
Title	Detection of Backscattered Electrons in Environmental Scaning Electron Microscope Detection of Backscattered Electrons in Environmental Scaning Electron Microscope (en)
skos:prefLabel	Detection of Backscattered Electrons in Environmental Scaning Electron Microscope Detection of Backscattered Electrons in Environmental Scaning Electron Microscope (en)
skos:notation	RIV/00216305:26220/03:PU39624!RIV11-MSM-26220___
http://linked.open...avai/riv/aktivita	P V Z
http://linked.open...avai/riv/aktivity	P(GA102/01/1271), V, Z(MSM 262200010)
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Jirák, Josef Špinka, Jiří Autrata, Rudolf Wandrol, Petr
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta elektrotechniky a komunikačních technologií
http://linked.open...dnocenehoVysledku	603257
http://linked.open...ai/riv/idVysledku	RIV/00216305:26220/03:PU39624
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	backscattered, electron, environmental, scanning, microscope (en)
http://linked.open.../riv/klicoveSlovo	environmental microscope backscattered electron scanning
http://linked.open...ontrolniKodProRIV	[3F2FA848AC7E]
http://linked.open...v/mistoKonaniAkce	Pula
http://linked.open...i/riv/mistoVydani	Pula, Croatia
http://linked.open...i/riv/nazevZdroje	Proceedings 6th Multinational Congress on Microscopy
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	4 (xsd:int)
http://linked.open...vavai/riv/projekt	Study of detection methods and systems in extreme conditions of environmental scanning electron microscopy
http://linked.open...UplatneniVysledku	2003
http://linked.open...iv/tvurceVysledku	Autrata, Rudolf Jirák, Josef Wandrol, Petr Špinka, Jiří
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2003-06-01 (xsd:date)
http://linked.open...n/vavai/riv/zamer	http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20262200010
number of pages	2 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Neuveden
http://localhost/t...ganizacniJednotka	26220

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