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| rdf:type
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| Description
| - Niobium Oxide capacitor, known as OxiCap, has already found its place in the market as a cheap and reliable non-burning component. The study of conductivity mechanisms has been done to prove its excellent stability, reliability and non-burning performance. Set of electrical measurements as VA characteristics in forward and reverse mode, frequency characteristics of capacitance, temperature or time dependency of basic parameters together with measurements of basic physical parameters enabled to propose tthe theoretical model of NbO - Nb2O5 - MnO2 system. OxiCap shows identical conductivity mechanism as tantalum capacitor, but furthermore a unique mechanism appears after dielectric breakdown. It causes a high resistance failure mode of NbO capacitor and limits the current bellow the capacitor's thermal runaway point, which prevents capacitor's burning, whereas filtering characteristics remain unchanged. The paper compares the charge carrier transport mechanism and noise of Niobium Oxide capacitor with N
- Niobium Oxide capacitor, known as OxiCap, has already found its place in the market as a cheap and reliable non-burning component. The study of conductivity mechanisms has been done to prove its excellent stability, reliability and non-burning performance. Set of electrical measurements as VA characteristics in forward and reverse mode, frequency characteristics of capacitance, temperature or time dependency of basic parameters together with measurements of basic physical parameters enabled to propose tthe theoretical model of NbO - Nb2O5 - MnO2 system. OxiCap shows identical conductivity mechanism as tantalum capacitor, but furthermore a unique mechanism appears after dielectric breakdown. It causes a high resistance failure mode of NbO capacitor and limits the current bellow the capacitor's thermal runaway point, which prevents capacitor's burning, whereas filtering characteristics remain unchanged. The paper compares the charge carrier transport mechanism and noise of Niobium Oxide capacitor with N (en)
- Niobium Oxide capacitor, known as OxiCap, has already found its place in the market as a cheap and reliable non-burning component. The study of conductivity mechanisms has been done to prove its excellent stability, reliability and non-burning performance. Set of electrical measurements as VA characteristics in forward and reverse mode, frequency characteristics of capacitance, temperature or time dependency of basic parameters together with measurements of basic physical parameters enabled to propose tthe theoretical model of NbO - Nb2O5 - MnO2 system. OxiCap shows identical conductivity mechanism as tantalum capacitor, but furthermore a unique mechanism appears after dielectric breakdown. It causes a high resistance failure mode of NbO capacitor and limits the current bellow the capacitor's thermal runaway point, which prevents capacitor's burning, whereas filtering characteristics remain unchanged. The paper compares the charge carrier transport mechanism and noise of Niobium Oxide capacitor with N (cs)
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| Title
| - Vodivostní princip, poruchy a šumové charakteristiky NbO kondenzatorů (cs)
- Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors
- Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors (en)
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| skos:prefLabel
| - Vodivostní princip, poruchy a šumové charakteristiky NbO kondenzatorů (cs)
- Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors
- Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors (en)
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| skos:notation
| - RIV/00216305:26220/03:PU39196!RIV06-MSM-26220___
|
| http://linked.open.../vavai/riv/strany
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| http://linked.open...avai/riv/aktivita
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| http://linked.open...avai/riv/aktivity
| - P(ME 605), Z(MSM 262200022)
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| http://linked.open...vai/riv/dodaniDat
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| http://linked.open...aciTvurceVysledku
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| http://linked.open.../riv/druhVysledku
| |
| http://linked.open...iv/duvernostUdaju
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| http://linked.open...titaPredkladatele
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| http://linked.open...dnocenehoVysledku
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| http://linked.open...ai/riv/idVysledku
| - RIV/00216305:26220/03:PU39196
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| http://linked.open...riv/jazykVysledku
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| http://linked.open.../riv/klicovaSlova
| - Niobium oxide, Capacitors, Passive components, Breakdown (en)
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| http://linked.open.../riv/klicoveSlovo
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| http://linked.open...ontrolniKodProRIV
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| http://linked.open...v/mistoKonaniAkce
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| http://linked.open...i/riv/mistoVydani
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| http://linked.open...i/riv/nazevZdroje
| - CARTS - EUROPE 2003 Proceedings
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| http://linked.open...in/vavai/riv/obor
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| http://linked.open...ichTvurcuVysledku
| |
| http://linked.open...cetTvurcuVysledku
| |
| http://linked.open...vavai/riv/projekt
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| http://linked.open...UplatneniVysledku
| |
| http://linked.open...iv/tvurceVysledku
| - Grmela, Lubomír
- Höschl, Pavel
- Sedláková, Vlasta
- Šikula, Josef
- Zedníček, Tomáš
- Hlávka, Jan
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| http://linked.open...vavai/riv/typAkce
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| http://linked.open.../riv/zahajeniAkce
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| http://linked.open...n/vavai/riv/zamer
| |
| issn
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| number of pages
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| http://purl.org/ne...btex#hasPublisher
| - Electronic Components Institute Internationale Ltd.
|
| http://localhost/t...ganizacniJednotka
| |
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