About: Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices     Goto   Sponge   NotDistinct   Permalink

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  • Electrical characterization methods for the analysis of alternating current thin-film electroluminescent (ACTFEL) devices are presented. Particular emphasis is devoted to characterization techniques because ACTFEL devices are electro-optic display devices whose performance is to a large extent determined by their electrical properties. Steady-state electrical characterization methods discussed in this paper include charge-voltage (Q-V), capacitance-voltage (CV), internal charge-phosphor field (Q-Fp),, and maximum charge-maximum applied voltage (Qmax-Vmax) analysis. These electrical characterization methods are illustrated by reviewing relevant results obtained from the analysis of evaporated ZnS:Mn devices.
  • Electrical characterization methods for the analysis of alternating current thin-film electroluminescent (ACTFEL) devices are presented. Particular emphasis is devoted to characterization techniques because ACTFEL devices are electro-optic display devices whose performance is to a large extent determined by their electrical properties. Steady-state electrical characterization methods discussed in this paper include charge-voltage (Q-V), capacitance-voltage (CV), internal charge-phosphor field (Q-Fp),, and maximum charge-maximum applied voltage (Qmax-Vmax) analysis. These electrical characterization methods are illustrated by reviewing relevant results obtained from the analysis of evaporated ZnS:Mn devices. (en)
Title
  • Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices
  • Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices (en)
skos:prefLabel
  • Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices
  • Electrooptical Characterization of ZnS:Mn Thin-film Electroluminescent Devices (en)
skos:notation
  • RIV/00216305:26220/03:PU37672!RIV/2004/MSM/262204/N
http://linked.open.../vavai/riv/strany
  • 287-290
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(ME 544), P(OC 523.40), Z(MSM 262200022)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
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  • 605706
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/03:PU37672
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Electroluminescence, thin film, electrical characterization, ACTFEL, ZnS (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [BA95AA15F46A]
http://linked.open...v/mistoKonaniAkce
  • Brno
http://linked.open...i/riv/mistoVydani
  • Brno
http://linked.open...i/riv/nazevZdroje
  • The 10th EDS 2003 Electronic Devices and Systems Conference
http://linked.open...in/vavai/riv/obor
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http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Grmela, Lubomír
  • Tománek, Pavel
  • Dobis, Pavel
  • Brüstlová, Jitka
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • Ing. Zdeněk Novotný CSc.
https://schema.org/isbn
  • 80-214-2452-4
http://localhost/t...ganizacniJednotka
  • 26220
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