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  • This contribution presents experimental results obtained by deposition double-layer system made by means of electron-beam vacuum evaporation technique. We oriented our effort to short-wavelength 633 - 635 nm laser diodes. These devices are emitting close to the wavelength of traditional He-Ne lasers with an intention to use them in extended-cavity laser design for metrological purposes. The resulting reflectivities were evaluated by measuring a testing plate of GaAs and by measuring a %22modulation depth%22%22 of a coated diode emission spectra. Our best results were reflectivities well below 10-4 and the repeatibility of the deposition process in a range not exceeding 2x10-4.
  • This contribution presents experimental results obtained by deposition double-layer system made by means of electron-beam vacuum evaporation technique. We oriented our effort to short-wavelength 633 - 635 nm laser diodes. These devices are emitting close to the wavelength of traditional He-Ne lasers with an intention to use them in extended-cavity laser design for metrological purposes. The resulting reflectivities were evaluated by measuring a testing plate of GaAs and by measuring a %22modulation depth%22%22 of a coated diode emission spectra. Our best results were reflectivities well below 10-4 and the repeatibility of the deposition process in a range not exceeding 2x10-4. (en)
Title
  • Residual Reflectivity of Amplification Media for Extended-Cavity Laser
  • Residual Reflectivity of Amplification Media for Extended-Cavity Laser (en)
skos:prefLabel
  • Residual Reflectivity of Amplification Media for Extended-Cavity Laser
  • Residual Reflectivity of Amplification Media for Extended-Cavity Laser (en)
skos:notation
  • RIV/00216305:26220/02:PU29889!RIV/2003/MSM/262203/N
http://linked.open.../vavai/riv/strany
  • 352-356
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • Z(MSM 262200011), Z(MSM 262200022)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 662207
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/02:PU29889
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • semiconductor laser, laser chip, antireflection coating (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [2A804FE73B1B]
http://linked.open...v/mistoKonaniAkce
  • Novosibirsk
http://linked.open...i/riv/mistoVydani
  • Washington, USA
http://linked.open...i/riv/nazevZdroje
  • Seveth International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...ocetUcastnikuAkce
http://linked.open...nichUcastnikuAkce
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Wilfert, Otakar
  • Růžička, Bohdan
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
http://linked.open...n/vavai/riv/zamer
number of pages
http://purl.org/ne...btex#hasPublisher
  • SPIE-The International Society for Optical Engineering
https://schema.org/isbn
  • 0-8194-4686-6
http://localhost/t...ganizacniJednotka
  • 26220
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