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  • Reliability is basically a quality parameter which must be incorporated into the product. The reliability attributes must be established already at the design phase. With increasing device complexity, reliability becomes an elusive, but significant parameter to define and achieve. It also becomes more difficult to control, demonstrate, and ensure as an operational characteristic under the projected conditions of use by the customer. This article summarizes the conceptions of the evaluation of the reliabbility of electronic devices.
  • Reliability is basically a quality parameter which must be incorporated into the product. The reliability attributes must be established already at the design phase. With increasing device complexity, reliability becomes an elusive, but significant parameter to define and achieve. It also becomes more difficult to control, demonstrate, and ensure as an operational characteristic under the projected conditions of use by the customer. This article summarizes the conceptions of the evaluation of the reliabbility of electronic devices. (en)
Title
  • Stress Testing in the Evaluation the Reliability of Electronic Devices
  • Stress Testing in the Evaluation the Reliability of Electronic Devices (en)
skos:prefLabel
  • Stress Testing in the Evaluation the Reliability of Electronic Devices
  • Stress Testing in the Evaluation the Reliability of Electronic Devices (en)
skos:notation
  • RIV/00216305:26220/01:PU24378!RIV/2002/GA0/262202/N
http://linked.open.../vavai/riv/strany
  • 253-257
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA102/00/0938)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
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  • 697394
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/01:PU24378
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • reliability, environmental tests, hazard rate model, burn-in (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [5B4E179A70AD]
http://linked.open...v/mistoKonaniAkce
  • Chania, Crete, Greece
http://linked.open...i/riv/mistoVydani
  • Crete 2001
http://linked.open...i/riv/nazevZdroje
  • Socrates Workshop 2001. Intensive Training Programme in Electronic System Design. Proceedings
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...iv/tvurceVysledku
  • Novotný, Radovan
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
number of pages
http://purl.org/ne...btex#hasPublisher
  • Ing. Zdeněk Novotný CSc.
https://schema.org/isbn
  • 80-214-2027-8
http://localhost/t...ganizacniJednotka
  • 26220
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