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  • Recently, various versions of Scanning Near-Field Optical Microscopes (SNOM) have been developed, pushing the limits of lateral resolution beyond the Rayleigh criterion: the value of /30 instead /2 have been reached. Unfortunately, images obtained by SNOM depend strongly on the experimental conditions (angle of incidence, polarization, incidence plane direction, sample nature,…). Theoretical studies are thus necessary for interpreting experimental data. Here, we present a model of compleex samples (multilayers) and to the general tip geometry. Moreover, this model can be used for various SNOM configurations and to take the sample-electromagnetic coupling into account.
  • Recently, various versions of Scanning Near-Field Optical Microscopes (SNOM) have been developed, pushing the limits of lateral resolution beyond the Rayleigh criterion: the value of /30 instead /2 have been reached. Unfortunately, images obtained by SNOM depend strongly on the experimental conditions (angle of incidence, polarization, incidence plane direction, sample nature,…). Theoretical studies are thus necessary for interpreting experimental data. Here, we present a model of compleex samples (multilayers) and to the general tip geometry. Moreover, this model can be used for various SNOM configurations and to take the sample-electromagnetic coupling into account. (en)
Title
  • Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy
  • Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy (en)
skos:prefLabel
  • Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy
  • Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy (en)
skos:notation
  • RIV/00216305:26220/00:PU24015!RIV/2003/MSM/262203/N
http://linked.open.../vavai/riv/strany
  • 85-90
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(OC 523.40)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
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http://linked.open...iv/duvernostUdaju
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  • 713611
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26220/00:PU24015
http://linked.open...riv/jazykVysledku
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  • scanning near-field optical microscopy, probe, sample, coating, resolution (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [F925B4FE9197]
http://linked.open...v/mistoKonaniAkce
  • Trnava
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  • Trnava
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  • CO-MAT-TECH 2000
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http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Liška, Miroslav
  • Dobisová, Markéta
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
number of pages
http://purl.org/ne...btex#hasPublisher
  • Slovenská technická univerzita v Bratislave
https://schema.org/isbn
  • 80-227-1413-5
http://localhost/t...ganizacniJednotka
  • 26220
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