About: Application of FIB technique to study of early fatigue damage in polycrystals

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Focused ion beam (FIB) technique together with other advanced microscopic techniques were applied to study early microstructural changes leading to crack initiation in fatigued polycrystals. Dislocation structures of persistent slip bands (PSBs) and surrounding matrix were revealed in the bulk of surface grains by electron channelling contrast imaging (ECCI) technique on the FIB cross-sections. True shape of extrusions, intrusions and the path of initiated fatigue cracks were assessed in three dimensions by serial FIB cross-sectioning (FIB tomography). Advantageous potential of FIB technique and its other possible utilization in fatigue crack initiation studies in polycrystals are highlighted. Focused ion beam (FIB) technique together with other advanced microscopic techniques were applied to study early microstructural changes leading to crack initiation in fatigued polycrystals. Dislocation structures of persistent slip bands (PSBs) and surrounding matrix were revealed in the bulk of surface grains by electron channelling contrast imaging (ECCI) technique on the FIB cross-sections. True shape of extrusions, intrusions and the path of initiated fatigue cracks were assessed in three dimensions by serial FIB cross-sectioning (FIB tomography). Advantageous potential of FIB technique and its other possible utilization in fatigue crack initiation studies in polycrystals are highlighted. (en)
Title	Application of FIB technique to study of early fatigue damage in polycrystals Application of FIB technique to study of early fatigue damage in polycrystals (en)
skos:prefLabel	Application of FIB technique to study of early fatigue damage in polycrystals Application of FIB technique to study of early fatigue damage in polycrystals (en)
skos:notation	RIV/00216305:26210/10:PU87809!RIV12-MSM-26210___
http://linked.open...avai/riv/aktivita	P S Z
http://linked.open...avai/riv/aktivity	P(1QS200410502), P(GA101/07/1500), P(GA106/06/1096), S, Z(AV0Z20410507)
http://linked.open...iv/cisloPeriodika	1
http://linked.open...vai/riv/dodaniDat	2012
http://linked.open...aciTvurceVysledku	Man, Jiří Kuběna, Ivo
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta strojního inženýrství
http://linked.open...dnocenehoVysledku	247420
http://linked.open...ai/riv/idVysledku	RIV/00216305:26210/10:PU87809
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	focused ion beam, fatigue crack initiation, extrusion, intrusion (en)
http://linked.open.../riv/klicoveSlovo	intrusion focused ion beam fatigue crack initiation extrusion
http://linked.open...odStatuVydavatele	GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV	[7E1F2BD7D69F]
http://linked.open...i/riv/nazevZdroje	Journal of Physics: Conference Series
http://linked.open...in/vavai/riv/obor	JL
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	6 (xsd:int)
http://linked.open...vavai/riv/projekt	Novel principles for life prediction in variable loading of components Properties of engineering materials under development applicable in the near future in traffic, medicine and power generating industry Role of lattice defects in early stages of fatigue damage in structural materials
http://linked.open...UplatneniVysledku	2010
http://linked.open...v/svazekPeriodika	240
http://linked.open...iv/tvurceVysledku	Man, Jiří Polák, Jaroslav Kuběna, Ivo Vystavěl, Tomáš Weidner, Anja Skrotzki, Werner
http://linked.open...n/vavai/riv/zamer	Physical properties of advanced materials in relation to their microstructure and processing
issn	1742-6588
number of pages	4 (xsd:int)
http://localhost/t...ganizacniJednotka	26210

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