About: Grain Contrast Imaging in UHV SLEEM

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Study of the grain structure in the equal channel angular pressing processed copper by means of the cathode lens equipped ultrahigh vacuum scanning low energy electron microscope is reported. The grain contrast was found achieving its maximum at electron energies below about 30 eV where it alternated its sign and exhibited dependence on electron energy specific for the grain orientation. The energy dependence of the electron reflectance seemed to be capable of serving as a fingerprint enabling determination of the crystalline orientation. In the cathode lens mode at hundreds of eV fine details of the microstructure are also observable including twins and low angle grain boundaries. This is explained by acquisition of high-angle backscattered slow electrons, normally not acquired in standard scanning electron microscopes. The very low energy electron reflectance is promising as an alternative to the EBSD method owing to its high resolution and fast data acquisition. Study of the grain structure in the equal channel angular pressing processed copper by means of the cathode lens equipped ultrahigh vacuum scanning low energy electron microscope is reported. The grain contrast was found achieving its maximum at electron energies below about 30 eV where it alternated its sign and exhibited dependence on electron energy specific for the grain orientation. The energy dependence of the electron reflectance seemed to be capable of serving as a fingerprint enabling determination of the crystalline orientation. In the cathode lens mode at hundreds of eV fine details of the microstructure are also observable including twins and low angle grain boundaries. This is explained by acquisition of high-angle backscattered slow electrons, normally not acquired in standard scanning electron microscopes. The very low energy electron reflectance is promising as an alternative to the EBSD method owing to its high resolution and fast data acquisition. (en)
Title	Grain Contrast Imaging in UHV SLEEM Grain Contrast Imaging in UHV SLEEM (en)
skos:prefLabel	Grain Contrast Imaging in UHV SLEEM Grain Contrast Imaging in UHV SLEEM (en)
skos:notation	RIV/00216305:26210/10:PU85238!RIV11-MSM-26210___
http://linked.open...avai/riv/aktivita	P S Z
http://linked.open...avai/riv/aktivity	P(OE08012), S, Z(AV0Z20650511), Z(MSM0021630508)
http://linked.open...iv/cisloPeriodika	2
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Mikmeková, Šárka Pantělejev, Libor Man, Ondřej
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta strojního inženýrství
http://linked.open...dnocenehoVysledku	260946
http://linked.open...ai/riv/idVysledku	RIV/00216305:26210/10:PU85238
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	scanning low energy electron microscopy, electron backscatter diffraction (EBSD), grain contrast, ultra-fine grained materials (en)
http://linked.open.../riv/klicoveSlovo	scanning low energy electron microscopy grain contrast electron backscatter diffraction (EBSD) ultra-fine grained materials
http://linked.open...odStatuVydavatele	JP - Japonsko
http://linked.open...ontrolniKodProRIV	[932F57A8B059]
http://linked.open...i/riv/nazevZdroje	MATERIALS TRANSACTIONS
http://linked.open...in/vavai/riv/obor	JG
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	6 (xsd:int)
http://linked.open...vavai/riv/projekt	Contrast and detection in scanning electron microscopy
http://linked.open...UplatneniVysledku	2010
http://linked.open...v/svazekPeriodika	51
http://linked.open...iv/tvurceVysledku	Mikmeková, Šárka Hovorka, Miloš Müllerová, Ilona Frank, Luděk Pantělejev, Libor Man, Ondřej
http://linked.open...n/vavai/riv/zamer	Research into experimental methods for examination of the physical properties of matter and their application in advanced technologies Anorganické nanomateriály a nanostruktury: vytváření, analýza, vlastnosti
issn	1345-9678
number of pages	5 (xsd:int)
http://localhost/t...ganizacniJednotka	26210

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