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  • Studium tvorby a oxidace PtSi (cs)
  • In the paper we present the results on the formation of platinum silicide (PtSi) by means of synchrotron radiation photoelectron spectroscopy (SR-PES) and show the effect of a Pt/Si sample exposure to both a low and high-pressure oxygen atmosphere at the end of an annealing process. We have carried out a detailed analysis of high resolution photoelectron spectra of the Pt 4f and Si 2p peaks which were taken during the sample annealing at specific temperatures. In addition to the generally known Pt2Si and PtSi phases we have recognized an additional intermediate phase during the formation of Pt2Si and attributed it to the Pt3Si phase. We have proved that silicon diffuses towards the sample surface. The results of a low-pressure oxygen experiment have shown that oxygen binds only to surface silicon, however, in the case of a PtSi sample prepared externally in the ON Semiconductor labs under nitrogen/oxygen atmosphere oxygen binds not only to surface silicon but also takes over Si atoms out of the PtSi p
  • In the paper we present the results on the formation of platinum silicide (PtSi) by means of synchrotron radiation photoelectron spectroscopy (SR-PES) and show the effect of a Pt/Si sample exposure to both a low and high-pressure oxygen atmosphere at the end of an annealing process. We have carried out a detailed analysis of high resolution photoelectron spectra of the Pt 4f and Si 2p peaks which were taken during the sample annealing at specific temperatures. In addition to the generally known Pt2Si and PtSi phases we have recognized an additional intermediate phase during the formation of Pt2Si and attributed it to the Pt3Si phase. We have proved that silicon diffuses towards the sample surface. The results of a low-pressure oxygen experiment have shown that oxygen binds only to surface silicon, however, in the case of a PtSi sample prepared externally in the ON Semiconductor labs under nitrogen/oxygen atmosphere oxygen binds not only to surface silicon but also takes over Si atoms out of the PtSi p (en)
Title
  • A study of the formation and oxidation of PtSi by SR-PES
  • A study of the formation and oxidation of PtSi by SR-PES (en)
  • Studium tvorby a oxidace PtSi (cs)
skos:prefLabel
  • A study of the formation and oxidation of PtSi by SR-PES
  • A study of the formation and oxidation of PtSi by SR-PES (en)
  • Studium tvorby a oxidace PtSi (cs)
skos:notation
  • RIV/00216305:26210/06:PU62936!RIV07-MSM-26210___
http://linked.open.../vavai/riv/strany
  • 4717-4722
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • Z(MSM0021630508)
http://linked.open...iv/cisloPeriodika
  • 20
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 463857
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26210/06:PU62936
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Platinum silicide, PtSi, Oxidation, Synchrotron radiation photoelectron spectroscopy (SR-PES), X-ray photoelectron spectroscopy (XPS) (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • NL - Nizozemsko
http://linked.open...ontrolniKodProRIV
  • [F611DECE99B1]
http://linked.open...i/riv/nazevZdroje
  • Surface Science
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 600
http://linked.open...iv/tvurceVysledku
  • Šikola, Tomáš
  • Čechal, Jan
http://linked.open...n/vavai/riv/zamer
issn
  • 0039-6028
number of pages
http://localhost/t...ganizacniJednotka
  • 26210
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