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Description
  • Je prezentován nový přístup k měření drsnosti povrchu založený na použití digitální dvouvlnové holografické interferenční mikroskopii se syntetickou vlnovou délkou. Dva hologramy náhodně drsného povrchu jsou postupně při dvou vlnových délkách zaznamenány CCD kamerou. Digitální součet obou hologramů je numericky rekonstruován. Rekonstruované digitální vlny spolu numericky interferují. Parametry měřeného drsného povrchu mohou být určeny z tvaru proužků ve vzniklém digitálním interferogramu. Rozsah měřitelné drsnosti povrchu je určen syntetickou vlnovou délkou, která je nepřímo úměrná rozdílu použitých vlnových délek. (cs)
  • A new approach to surface roughness measurement based on the digital two-wavelength holographic interference microscopy with the synthetic wavelength is presented. Two holograms of a rough surface are recorded step by step at two wavelengths of laser light by means of a CCD camera. Both holograms are numerically superposed and then reconstructed. Two reconstructed digital waves obtained numerically interfere. The surface roughness parameters can be determined from the shape of interference fringes in that interferogram created. The range of measurable height irregularities of the surface is given by the synthetic wavelength, which is indirectly proportional to the difference of the selected wavelengths.
  • A new approach to surface roughness measurement based on the digital two-wavelength holographic interference microscopy with the synthetic wavelength is presented. Two holograms of a rough surface are recorded step by step at two wavelengths of laser light by means of a CCD camera. Both holograms are numerically superposed and then reconstructed. Two reconstructed digital waves obtained numerically interfere. The surface roughness parameters can be determined from the shape of interference fringes in that interferogram created. The range of measurable height irregularities of the surface is given by the synthetic wavelength, which is indirectly proportional to the difference of the selected wavelengths. (en)
Title
  • Digital two-wavelength holographic interference microscopy for surface roughness measurement
  • Dvouvlnová holografická interferenční mikroskopie pro měření drsnosti povrchu (cs)
  • Digital two-wavelength holographic interference microscopy for surface roughness measurement (en)
skos:prefLabel
  • Digital two-wavelength holographic interference microscopy for surface roughness measurement
  • Dvouvlnová holografická interferenční mikroskopie pro měření drsnosti povrchu (cs)
  • Digital two-wavelength holographic interference microscopy for surface roughness measurement (en)
skos:notation
  • RIV/00216305:26210/05:PU54589!RIV07-GA0-26210___
http://linked.open.../vavai/riv/strany
  • 59450I-1
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA101/01/1104)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 518133
http://linked.open...ai/riv/idVysledku
  • RIV/00216305:26210/05:PU54589
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • Digital two-wavelength hologgraphic interferometry, surface roughness measurement (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [34287A7984E4]
http://linked.open...v/mistoKonaniAkce
  • Nitra
http://linked.open...i/riv/mistoVydani
  • Bellingham, Washington, USA
http://linked.open...i/riv/nazevZdroje
  • 14 th Slovak-Czech Polish Conference on Wave and Quantum Aspects of Contemporary Optics
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Ohlídal, Ivan
  • Ohlídal, Miloslav
  • Jákl, Miloš
  • Šír, Luděk
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
number of pages
http://purl.org/ne...btex#hasPublisher
  • Neuveden
https://schema.org/isbn
  • 0-8194-5951-8
http://localhost/t...ganizacniJednotka
  • 26210
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