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rdf:type
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Description
| - Deposition of ultra-thin GaN layers and their analysis using XPS, SIMS, TOF-LEIS.
- Deposition of ultra-thin GaN layers and their analysis using XPS, SIMS, TOF-LEIS. (en)
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Title
| - Deposition and in situ characterization of ultra-thin films
- Deposition and in situ characterization of ultra-thin films (en)
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skos:prefLabel
| - Deposition and in situ characterization of ultra-thin films
- Deposition and in situ characterization of ultra-thin films (en)
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skos:notation
| - RIV/00216305:26210/03:PU41935!RIV11-MSM-26210___
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(GA202/02/0767), P(ME 334), V, Z(MSM 262100002)
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/00216305:26210/03:PU41935
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - GaN, XPS, thin films (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...ontrolniKodProRIV
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http://linked.open...v/mistoKonaniAkce
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http://linked.open...i/riv/mistoVydani
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http://linked.open...i/riv/nazevZdroje
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...iv/tvurceVysledku
| - Kolíbal, Miroslav
- Mach, Jindřich
- Spousta, Jiří
- Voborný, Stanislav
- Šikola, Tomáš
- Bábor, Petr
- Průša, Stanislav
- Čechal, Jan
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http://linked.open...vavai/riv/typAkce
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http://linked.open.../riv/zahajeniAkce
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http://linked.open...n/vavai/riv/zamer
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number of pages
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http://purl.org/ne...btex#hasPublisher
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http://localhost/t...ganizacniJednotka
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