About: Low-temperature growth of SiCAlN films of high hardness on Si(111) substrates     Goto   Sponge   NotDistinct   Permalink

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  • Thin films of metastable SiCAlN solid solution were deposited on Si(111) substrates at 550-750 degreesC, considerably below the miscibility gap of SiC and AlN phases at 1900 degreesC. Our low-temperature growth was based upon thermally activated reactions between a unimolecular precursor H3SiCN and Al atoms from an evaporative cell in a molecular-beam-epitaxy chamber. Characterization of deposited films by spectroscopic and microscopic techniques yielded near-stoichiometric composition throughout the coolumnar wurtzite structure with lattice parameters very close to those of 2H-SiC and hexagonal AlN. An average hardness of 25 GPa was measured for the SiCAlN films, comparable to that measured for sapphire. (C) 2001 American Institute of Physics.
  • Thin films of metastable SiCAlN solid solution were deposited on Si(111) substrates at 550-750 degreesC, considerably below the miscibility gap of SiC and AlN phases at 1900 degreesC. Our low-temperature growth was based upon thermally activated reactions between a unimolecular precursor H3SiCN and Al atoms from an evaporative cell in a molecular-beam-epitaxy chamber. Characterization of deposited films by spectroscopic and microscopic techniques yielded near-stoichiometric composition throughout the coolumnar wurtzite structure with lattice parameters very close to those of 2H-SiC and hexagonal AlN. An average hardness of 25 GPa was measured for the SiCAlN films, comparable to that measured for sapphire. (C) 2001 American Institute of Physics. (en)
Title
  • Low-temperature growth of SiCAlN films of high hardness on Si(111) substrates
  • Low-temperature growth of SiCAlN films of high hardness on Si(111) substrates (en)
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  • Low-temperature growth of SiCAlN films of high hardness on Si(111) substrates
  • Low-temperature growth of SiCAlN films of high hardness on Si(111) substrates (en)
skos:notation
  • RIV/00216305:26210/02:PU29597!RIV/2003/MSM/262103/N
http://linked.open.../vavai/riv/strany
  • 2880-2882
http://linked.open...avai/riv/aktivita
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  • Z(MSM 262100002)
http://linked.open...iv/cisloPeriodika
  • 18
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  • 652149
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  • RIV/00216305:26210/02:PU29597
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • MOLECULAR-BEAM EPITAXY, SILICON-CARBIDE, SOLID-SOLUTIONS, ALUMINUM NITRIDE, DEPOSITION, SYSTEM, ALN, AIN (en)
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  • US - Spojené státy americké
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  • [A2417E90B82D]
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  • Applied Physics Letters
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  • 79
http://linked.open...iv/tvurceVysledku
  • Roučka, Radek
  • Crozier, P.
  • Kouvetakis, J.
  • Tolle, J.
  • Tsong, I.
  • Smith, D. J.
http://linked.open...n/vavai/riv/zamer
issn
  • 0003-6951
number of pages
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  • 26210
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