Noise measured across forward-biased silicon single-crystal solar cells may serve as a non-destructive reliability indicator. Burst noise, whose source consists of defects in the p-n junction space-charge region, was detected on a number of silicon single-crystal solar cells.
Noise measured across forward-biased silicon single-crystal solar cells may serve as a non-destructive reliability indicator. Burst noise, whose source consists of defects in the p-n junction space-charge region, was detected on a number of silicon single-crystal solar cells. (en)