About: Multifractal Characterization of Water Soluble Copper Phthalocyanine Based Films Surfaces

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: Multifractal Characterization of Water Soluble Copper Phthalocyanine Based Films Surfaces Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	This paper presents a multifractal approach to characterize the structural complexity of 3D surface roughness of CuTsPc films on the glass and quartz substrate, obtained with atomic force microscopy (AFM) analysis. CuTsPc films prepared by drop cast method were investigated. CuTsPc films surface roughness was studied by AFM in tappingmode (TM), in an aqueous environment, on square areas of 100 mu m(2) and 2500 mu m(2). A detailed methodology for CuTsPc films surface multifractal characterization, which may be applied for AFM data, was also presented. Analysis of surface roughness revealed that CuTsPc films have a multifractal geometry at various magnifications. The generalized dimension D-q and the singularity spectrum f(alpha) provided quantitative values that characterize the local scale properties of CuTsPc films surface morphology at nanometer scale. Multifractal analysis provides different yet complementary information to that offered by traditional surface statistical parameters. This paper presents a multifractal approach to characterize the structural complexity of 3D surface roughness of CuTsPc films on the glass and quartz substrate, obtained with atomic force microscopy (AFM) analysis. CuTsPc films prepared by drop cast method were investigated. CuTsPc films surface roughness was studied by AFM in tappingmode (TM), in an aqueous environment, on square areas of 100 mu m(2) and 2500 mu m(2). A detailed methodology for CuTsPc films surface multifractal characterization, which may be applied for AFM data, was also presented. Analysis of surface roughness revealed that CuTsPc films have a multifractal geometry at various magnifications. The generalized dimension D-q and the singularity spectrum f(alpha) provided quantitative values that characterize the local scale properties of CuTsPc films surface morphology at nanometer scale. Multifractal analysis provides different yet complementary information to that offered by traditional surface statistical parameters. (en)
Title	Multifractal Characterization of Water Soluble Copper Phthalocyanine Based Films Surfaces Multifractal Characterization of Water Soluble Copper Phthalocyanine Based Films Surfaces (en)
skos:prefLabel	Multifractal Characterization of Water Soluble Copper Phthalocyanine Based Films Surfaces Multifractal Characterization of Water Soluble Copper Phthalocyanine Based Films Surfaces (en)
skos:notation	RIV/00216275:25310/14:39898651!RIV15-TA0-25310___
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(EE2.3.30.0021), P(TE01020022)
http://linked.open...iv/cisloPeriodika	4
http://linked.open...vai/riv/dodaniDat	2015
http://linked.open...aciTvurceVysledku	Wágner, Tomáš Pathak, Dinesh
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Univerzita Pardubice / Fakulta chemicko-technologická
http://linked.open...dnocenehoVysledku	30983
http://linked.open...ai/riv/idVysledku	RIV/00216275:25310/14:39898651
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	surface roughness; multifractal analysis; atomic force microscopy; CuTsPc films; organic semiconductors (en)
http://linked.open.../riv/klicoveSlovo	CuTsPc films surface roughness multifractal analysis atomic force microscopy organic semiconductors
http://linked.open...odStatuVydavatele	KR - Korejská republika
http://linked.open...ontrolniKodProRIV	[58B5A94DD318]
http://linked.open...i/riv/nazevZdroje	Electronic Materials Letters
http://linked.open...in/vavai/riv/obor	CA
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	8 (xsd:int)
http://linked.open...vavai/riv/projekt	Strenthening of Research and Development Teams at the University of Pardubice Flexible printed microelectronics based on organic or hybrid materials, FLEXPRINT
http://linked.open...UplatneniVysledku	2014
http://linked.open...v/svazekPeriodika	10
http://linked.open...iv/tvurceVysledku	Wágner, Tomáš Stach, Sebastian Talu, Mihai Talu, Stefan Pathak, Dinesh Bedi, R. K. Kumar, Anshul Mahajan, Aman
http://linked.open...ain/vavai/riv/wos	000339642600006
issn	1738-8090
number of pages	12 (xsd:int)
http://bibframe.org/vocab/doi	10.1007/s13391-013-3270-4
http://localhost/t...ganizacniJednotka	25310

Faceted Search & Find service v1.16.118 as of Jun 21 2024

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3240 as of Jun 21 2024, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (126 GB total memory, 59 GB memory in use)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2024 OpenLink Software