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Description
| - We report on a combined off-specular and specular x-ray scattering growth study of ultrathin films of the prototypical organic semiconductor diindenoperylene (DIP, C32H16). We investigate the evolution of the in-plane correlation length and the growth kinetics of the films including their dependence on the substrate temperature and the growth rate. We observe a temperature-dependent collective rearrangement of DIP molecules from a transient surface induced to the thin-film phase, which can be rationalized by incorporating a thickness-dependent out-of-plane lattice parameter. We further observe that the nucleation behavior of DIP changes from the first to the second monolayer, which we relate to a difference in the diffusion length of the molecules.
- We report on a combined off-specular and specular x-ray scattering growth study of ultrathin films of the prototypical organic semiconductor diindenoperylene (DIP, C32H16). We investigate the evolution of the in-plane correlation length and the growth kinetics of the films including their dependence on the substrate temperature and the growth rate. We observe a temperature-dependent collective rearrangement of DIP molecules from a transient surface induced to the thin-film phase, which can be rationalized by incorporating a thickness-dependent out-of-plane lattice parameter. We further observe that the nucleation behavior of DIP changes from the first to the second monolayer, which we relate to a difference in the diffusion length of the molecules. (en)
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Title
| - Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering
- Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering (en)
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skos:prefLabel
| - Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering
- Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering (en)
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skos:notation
| - RIV/00216224:14740/14:00076244!RIV15-MSM-14740___
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/00216224:14740/14:00076244
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - Thin film growth; organic semiconductors; X-ray scattering; molecular beam deposition (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
| - US - Spojené státy americké
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
| - Novák, Jiří
- Banerjee, Rupak
- Schreiber, Frank
- Frank, Christian
- Gerlach, Alexander
- Kowarik, Stefan
- Vorobiev, Alexei
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http://linked.open...ain/vavai/riv/wos
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issn
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number of pages
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http://bibframe.org/vocab/doi
| - 10.1103/PhysRevB.90.045410
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http://localhost/t...ganizacniJednotka
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