About: Monitoring and control of RF driven PVD, PECVD and etching plasmas using Fourier components of discharge voltages     Goto   Sponge   NotDistinct   Permalink

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  • PVD and PECVD require monitoring and control of the deposition process in order to reproducibly prepare coatings of desired quality. RF driven magnetron sputtering as well as RF driven PECVD processes use capacitively coupled plasma to deposit various types of thin films. Due to the nonlinearity of sheaths, higher harmonics of discharge voltage and current are produced in capacitive discharges. Since the sheaths are in contact with bulk plasma, higher harmonics are strong in particular when their frequencies are close to the series plasma–sheath resonance. Also, the harmonics are strong when they are not damped by collisions between electrons and neutrals. Both conditions are fulfilled at pressures typically below 10 Pa used in majority of PVD and PECVD applications. Fourier components of discharge voltages were measured in two different reactive plasmas and their response to creation or destruction of a thin film was studied.
  • PVD and PECVD require monitoring and control of the deposition process in order to reproducibly prepare coatings of desired quality. RF driven magnetron sputtering as well as RF driven PECVD processes use capacitively coupled plasma to deposit various types of thin films. Due to the nonlinearity of sheaths, higher harmonics of discharge voltage and current are produced in capacitive discharges. Since the sheaths are in contact with bulk plasma, higher harmonics are strong in particular when their frequencies are close to the series plasma–sheath resonance. Also, the harmonics are strong when they are not damped by collisions between electrons and neutrals. Both conditions are fulfilled at pressures typically below 10 Pa used in majority of PVD and PECVD applications. Fourier components of discharge voltages were measured in two different reactive plasmas and their response to creation or destruction of a thin film was studied. (en)
Title
  • Monitoring and control of RF driven PVD, PECVD and etching plasmas using Fourier components of discharge voltages
  • Monitoring and control of RF driven PVD, PECVD and etching plasmas using Fourier components of discharge voltages (en)
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  • Monitoring and control of RF driven PVD, PECVD and etching plasmas using Fourier components of discharge voltages
  • Monitoring and control of RF driven PVD, PECVD and etching plasmas using Fourier components of discharge voltages (en)
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  • RIV/00216224:14310/12:00057727!RIV13-GA0-14310___
http://linked.open...avai/riv/aktivita
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  • P(ED2.1.00/03.0086), P(GAP205/12/0407), P(GD104/09/H080)
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  • 151602
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  • RIV/00216224:14310/12:00057727
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  • reactive magnetron sputtering; PECVD; process monitoring and control; higher harmonics (en)
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http://linked.open...ontrolniKodProRIV
  • [A5E8B90DBD1B]
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  • Buršíková, Vilma
  • Dvořák, Pavel
  • Vašina, Petr
  • Žemlička, Radek
  • Klein, Peter
http://localhost/t...ganizacniJednotka
  • 14310
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