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Description
  • The combination of spectrophotometry and variable-angle spectroscopic ellipsometry is used for the optical characterization of a system consisting of transparent polymer film on a transparent polycarbonate substrate. In the region of sample transparency a relatively large depolarization is observed in ellipsometry. This can be explained by the presence of anisotropy in the film or substrate. The possibility of distinguishing between the depolarization enhanced by film and substrate anisotropy is discussed and tested using several models. It is shown that it is not possible to distinguish between these effects.
  • The combination of spectrophotometry and variable-angle spectroscopic ellipsometry is used for the optical characterization of a system consisting of transparent polymer film on a transparent polycarbonate substrate. In the region of sample transparency a relatively large depolarization is observed in ellipsometry. This can be explained by the presence of anisotropy in the film or substrate. The possibility of distinguishing between the depolarization enhanced by film and substrate anisotropy is discussed and tested using several models. It is shown that it is not possible to distinguish between these effects. (en)
Title
  • Anisotropy-enhanced depolarization on transparent film/substrate system
  • Anisotropy-enhanced depolarization on transparent film/substrate system (en)
skos:prefLabel
  • Anisotropy-enhanced depolarization on transparent film/substrate system
  • Anisotropy-enhanced depolarization on transparent film/substrate system (en)
skos:notation
  • RIV/00216224:14310/11:00050716!RIV12-MPO-14310___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(FR-TI1/168), Z(MSM0021622411)
http://linked.open...iv/cisloPeriodika
  • 9
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 186308
http://linked.open...ai/riv/idVysledku
  • RIV/00216224:14310/11:00050716
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • anisotropy; depolarization; optical properties; ellipsometry (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • NL - Nizozemsko
http://linked.open...ontrolniKodProRIV
  • [4F69580884FC]
http://linked.open...i/riv/nazevZdroje
  • Thin Solid Films
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 519
http://linked.open...iv/tvurceVysledku
  • Franta, Daniel
  • Nečas, David
  • Ohlídal, Ivan
http://linked.open...ain/vavai/riv/wos
  • 000289174200015
http://linked.open...n/vavai/riv/zamer
issn
  • 0040-6090
number of pages
http://bibframe.org/vocab/doi
  • 10.1016/j.tsf.2010.12.113
http://localhost/t...ganizacniJednotka
  • 14310
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