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rdf:type
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Description
| - Electrical conductivity, dielectric permittivity and mechanical hardness of the polycrystalline CeO2 + xSm2O3 (x = 0, 10.9-15.9 mol %) films prepared by Electron Beam Physical Vapour Deposition (EB-PVD) and Ionic Beam Assisted Deposition, (IBAD), techniques were investigated in dependence on their structure and microstructure influenced by the deposition conditions, namely composition, deposition temperature and Ar+ ion bombardment. The electrical conductivity of doped ceria prepared without Ar+ ion bombardment and investigated by the impedance spectroscopy, IS, was found to be predominantly ionic one under the oxidizing atmosphere/low-temperature conditions and the higher amounts of Sm2O3 (>10 mol %) used. The bulk conductivity as a part of total measured conductivity was a subject of interest because the grain boundary conductivity was found to be 3 orders of magnitude lower than the corresponding bulk conductivity.
- Electrical conductivity, dielectric permittivity and mechanical hardness of the polycrystalline CeO2 + xSm2O3 (x = 0, 10.9-15.9 mol %) films prepared by Electron Beam Physical Vapour Deposition (EB-PVD) and Ionic Beam Assisted Deposition, (IBAD), techniques were investigated in dependence on their structure and microstructure influenced by the deposition conditions, namely composition, deposition temperature and Ar+ ion bombardment. The electrical conductivity of doped ceria prepared without Ar+ ion bombardment and investigated by the impedance spectroscopy, IS, was found to be predominantly ionic one under the oxidizing atmosphere/low-temperature conditions and the higher amounts of Sm2O3 (>10 mol %) used. The bulk conductivity as a part of total measured conductivity was a subject of interest because the grain boundary conductivity was found to be 3 orders of magnitude lower than the corresponding bulk conductivity. (en)
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Title
| - Effect of crystallographic structure on electrical and mechanical characteristics of Sm2O3-Doped CeO2 films
- Effect of crystallographic structure on electrical and mechanical characteristics of Sm2O3-Doped CeO2 films (en)
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skos:prefLabel
| - Effect of crystallographic structure on electrical and mechanical characteristics of Sm2O3-Doped CeO2 films
- Effect of crystallographic structure on electrical and mechanical characteristics of Sm2O3-Doped CeO2 films (en)
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skos:notation
| - RIV/00216224:14310/11:00049535!RIV12-AV0-14310___
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(KAN311610701), S, Z(MSM0021622411)
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/00216224:14310/11:00049535
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - CeO2; Sm2O3; e-beam evaporation; ionic beam assisted deposition; impedance spectroscopy; indentation technique; electrical conductivity; dielectric permittivity; microhardness (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
| - Russian Journal of Electrochemistry
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
| - Buršíková, Vilma
- Hartmanová, Maria
- Kundracik, František
- Mansilla, C.
- Navrátil, Vladislav
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http://linked.open...n/vavai/riv/zamer
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issn
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number of pages
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http://localhost/t...ganizacniJednotka
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