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Description
  • Ultra-thin films of 57Fe deposited on silicon substrates and SiOxCyHz support layers and subsequently oxidized in laboratory atmosphere are studied by two optical methods: the combination of UV/VIS/NIR spectroscopic ellipsometry and spectrophotometry, used to find layer thicknesses and optical constants, and X-ray specular reflectometry, used to obtain the electron density depth profile. The results of both methods are compared and found to be in a relatively good agreement.
  • Ultra-thin films of 57Fe deposited on silicon substrates and SiOxCyHz support layers and subsequently oxidized in laboratory atmosphere are studied by two optical methods: the combination of UV/VIS/NIR spectroscopic ellipsometry and spectrophotometry, used to find layer thicknesses and optical constants, and X-ray specular reflectometry, used to obtain the electron density depth profile. The results of both methods are compared and found to be in a relatively good agreement. (en)
Title
  • Optical Characterization of Ultra-Thin Iron and Iron Oxide Films
  • Optical Characterization of Ultra-Thin Iron and Iron Oxide Films (en)
skos:prefLabel
  • Optical Characterization of Ultra-Thin Iron and Iron Oxide Films
  • Optical Characterization of Ultra-Thin Iron and Iron Oxide Films (en)
skos:notation
  • RIV/00216224:14310/09:00028505!RIV10-MSM-14310___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(KAN311610701), Z(MSM0021622410), Z(MSM0021622411)
http://linked.open...iv/cisloPeriodika
  • březen
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  • 331806
http://linked.open...ai/riv/idVysledku
  • RIV/00216224:14310/09:00028505
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  • iron; iron oxide; thin films; ellipsometry; spectrophotometry; X-ray reflection (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • JP - Japonsko
http://linked.open...ontrolniKodProRIV
  • [3506866ADA50]
http://linked.open...i/riv/nazevZdroje
  • e-Journal of Surface Science and Nanotechnology
http://linked.open...in/vavai/riv/obor
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  • 7
http://linked.open...iv/tvurceVysledku
  • Franta, Daniel
  • Nečas, David
  • Valtr, Miroslav
  • Zajíčková, Lenka
  • Sťahel, Pavel
  • Meduňa, Mojmír
  • Mikulík, Petr
http://linked.open...n/vavai/riv/zamer
issn
  • 1348-0391
number of pages
http://localhost/t...ganizacniJednotka
  • 14310
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