About: X-ray microdiffraction imaging investigations of wing tilt in epitaxially overgrown GaN

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About: X-ray microdiffraction imaging investigations of wing tilt in epitaxially overgrown GaN Goto Sponge NotDistinct Permalink

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	The crystalline quality in epitaxially laterally overgrown (ELO) GaN and the amount of wing tilt is characterized on a local basis, with high spatial and angular resolution. A method of full-field X-ray microdiffraction imaging, termed rocking curve imaging, is used to record simultaneously a large set of local X-ray diffraction profiles originating from sample surface areas of micrometer size. x-omega maps of diffracted intensity allow to quantify the amount of wing tilt in individual lateral ELO periods as well as to monitor the fluctuations of tilt between adjacent periods. Automated shape analysis of the full set of local rocking curves provides a means to quantitatively characterize the local crystalline perfection of GaN. The ELO window and wing regions can be clearly separated; comparison indicates an average improvement of crystal quality by a factor 3–4 due to the lateral overgrowth process. The crystalline quality in epitaxially laterally overgrown (ELO) GaN and the amount of wing tilt is characterized on a local basis, with high spatial and angular resolution. A method of full-field X-ray microdiffraction imaging, termed rocking curve imaging, is used to record simultaneously a large set of local X-ray diffraction profiles originating from sample surface areas of micrometer size. x-omega maps of diffracted intensity allow to quantify the amount of wing tilt in individual lateral ELO periods as well as to monitor the fluctuations of tilt between adjacent periods. Automated shape analysis of the full set of local rocking curves provides a means to quantitatively characterize the local crystalline perfection of GaN. The ELO window and wing regions can be clearly separated; comparison indicates an average improvement of crystal quality by a factor 3–4 due to the lateral overgrowth process. (en)
Title	X-ray microdiffraction imaging investigations of wing tilt in epitaxially overgrown GaN X-ray microdiffraction imaging investigations of wing tilt in epitaxially overgrown GaN (en)
skos:prefLabel	X-ray microdiffraction imaging investigations of wing tilt in epitaxially overgrown GaN X-ray microdiffraction imaging investigations of wing tilt in epitaxially overgrown GaN (en)
skos:notation	RIV/00216224:14310/06:00017349!RIV10-MSM-14310___
http://linked.open...avai/riv/aktivita	Z
http://linked.open...avai/riv/aktivity	Z(MSM0021622410)
http://linked.open...iv/cisloPeriodika	7
http://linked.open...vai/riv/dodaniDat	2010
http://linked.open...aciTvurceVysledku	Mikulík, Petr
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Masarykova univerzita / Přírodovědecká fakulta
http://linked.open...dnocenehoVysledku	509178
http://linked.open...ai/riv/idVysledku	RIV/00216224:14310/06:00017349
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	lattice tilt; diffraction; X-ray diffraction; GaN; ELO (en)
http://linked.open.../riv/klicoveSlovo	lattice tilt X-ray diffraction GaN diffraction ELO
http://linked.open...odStatuVydavatele	DE - Spolková republika Německo
http://linked.open...ontrolniKodProRIV	[012FBF852D11]
http://linked.open...i/riv/nazevZdroje	Physica stat.sol.(a)
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	8 (xsd:int)
http://linked.open...UplatneniVysledku	2006
http://linked.open...v/svazekPeriodika	203
http://linked.open...iv/tvurceVysledku	Baumbach, T. Mikulík, Petr Helfen, L. Pernot, P. Keller, S. Lübbert, D. Craven, M. D. DenBaars, S.
http://linked.open...n/vavai/riv/zamer	Physical and chemical properties of advanced materials and structures
issn	0031-8965
number of pages	6 (xsd:int)
http://localhost/t...ganizacniJednotka	14310

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