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  • In this paper results of the optical characterisation of double layers consisting of ZnTe and ZnSe thin films prepared by molecular beam epitaxy onto GaAs single crystal substrates are presented. For this optical characterisation the optical method based on combining variable angle spectroscopic ellipsometry and near-normal spectroscopic reflectometry is used in multi-sample modification applied within the spectral region 230-850 nm. Using this method the spectral dependences of the optical constants of the upper ZnTe thin films are determined within the spectral region mentioned above. Spectral dependences of the optical constants of the lower ZnSe thin films were determined within the spectral region 450-850 nm. Boundary roughness of these double layers and overlayers is respected. RMS values of the heights of the irregularities of the boundaries and thicknesses and optical constants of the overlayers are determined by means of the combined optical method as well.
  • In this paper results of the optical characterisation of double layers consisting of ZnTe and ZnSe thin films prepared by molecular beam epitaxy onto GaAs single crystal substrates are presented. For this optical characterisation the optical method based on combining variable angle spectroscopic ellipsometry and near-normal spectroscopic reflectometry is used in multi-sample modification applied within the spectral region 230-850 nm. Using this method the spectral dependences of the optical constants of the upper ZnTe thin films are determined within the spectral region mentioned above. Spectral dependences of the optical constants of the lower ZnSe thin films were determined within the spectral region 450-850 nm. Boundary roughness of these double layers and overlayers is respected. RMS values of the heights of the irregularities of the boundaries and thicknesses and optical constants of the overlayers are determined by means of the combined optical method as well. (en)
Title
  • Optical characterization of double layers containing epitaxial ZnSe and ZnTe films
  • Optical characterization of double layers containing epitaxial ZnSe and ZnTe films (en)
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  • Optical characterization of double layers containing epitaxial ZnSe and ZnTe films
  • Optical characterization of double layers containing epitaxial ZnSe and ZnTe films (en)
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  • RIV/00216224:14310/05:00013026!RIV10-GA0-14310___
http://linked.open...avai/riv/aktivita
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  • P(GA101/01/1104)
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  • 4
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  • 534687
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  • RIV/00216224:14310/05:00013026
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  • ellipsometry; spectrophotometry; epitaxial layer (en)
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  • GB - Spojené království Velké Británie a Severního Irska
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  • [1C6A0CA9A60B]
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  • Journal of Modern Optics
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  • 52
http://linked.open...iv/tvurceVysledku
  • Franta, Daniel
  • Ohlídal, Ivan
  • Šiler, Martin
  • Sitter, Helmut
  • Bonanni, Alberta
  • Montaigne-Ramil, Alberto
  • Stifter, David
issn
  • 0950-0340
number of pages
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  • 14310
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