About: Determination of lattice plane curvature and dislocation Burgers vector density in crystals by rocking curve imaging technique

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About: Determination of lattice plane curvature and dislocation Burgers vector density in crystals by rocking curve imaging technique Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In the present work the lattice plane curvature of a nearly dislocation free S:doped InP and a semi-insulating GaAs wafer crystals has been investigated using the method of X-ray rocking curve imaging based on the FReLoN CCD area detector with a pixel resolution from 10 to 40 um at the ID19 ESRF beamline. The geometry of the experiment is based on a vertical Si (111) monochromator and a horizontal sample scattering planes in the Bragg geometry (sigma-pi geometry). To determine the local lattice inclination, the effect of such dispersive setup on the measured local diffraction peak position has been accurately determined and the equations to determine the lattice plane curvature of the crystals under the condition of isotropic distribution of dislocation Burgers vectors are obtained. The analysis of the data showed that the shift of the Bragg condition is almost completely due to the lattice tilt rather than to the lattice parameter variation. Lattice displacements from the ideal lattice as large as 20 In the present work the lattice plane curvature of a nearly dislocation free S:doped InP and a semi-insulating GaAs wafer crystals has been investigated using the method of X-ray rocking curve imaging based on the FReLoN CCD area detector with a pixel resolution from 10 to 40 um at the ID19 ESRF beamline. The geometry of the experiment is based on a vertical Si (111) monochromator and a horizontal sample scattering planes in the Bragg geometry (sigma-pi geometry). To determine the local lattice inclination, the effect of such dispersive setup on the measured local diffraction peak position has been accurately determined and the equations to determine the lattice plane curvature of the crystals under the condition of isotropic distribution of dislocation Burgers vectors are obtained. The analysis of the data showed that the shift of the Bragg condition is almost completely due to the lattice tilt rather than to the lattice parameter variation. Lattice displacements from the ideal lattice as large as 20 (en)
Title	Determination of lattice plane curvature and dislocation Burgers vector density in crystals by rocking curve imaging technique Determination of lattice plane curvature and dislocation Burgers vector density in crystals by rocking curve imaging technique (en)
skos:prefLabel	Determination of lattice plane curvature and dislocation Burgers vector density in crystals by rocking curve imaging technique Determination of lattice plane curvature and dislocation Burgers vector density in crystals by rocking curve imaging technique (en)
skos:notation	RIV/00216224:14310/03:00009587!RIV/2004/MSM/143104/N
http://linked.open.../vavai/riv/strany	84-93
http://linked.open...avai/riv/aktivita	Z
http://linked.open...avai/riv/aktivity	Z(MSM 143100002)
http://linked.open...iv/cisloPeriodika	1
http://linked.open...vai/riv/dodaniDat	2004
http://linked.open...aciTvurceVysledku	Mikulík, Petr
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Masarykova univerzita / Přírodovědecká fakulta
http://linked.open...dnocenehoVysledku	603363
http://linked.open...ai/riv/idVysledku	RIV/00216224:14310/03:00009587
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	lattice tilt; diffraction; X-ray diffraction; wafers; defects; InP; GaAs (en)
http://linked.open.../riv/klicoveSlovo	GaAs InP lattice tilt X-ray diffraction defects diffraction wafers
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[04A014BDF25F]
http://linked.open...i/riv/nazevZdroje	Proceedings of SPIE: Crystals, Multilayers, and Other Synchrotron Optics
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	8 (xsd:int)
http://linked.open...ocetUcastnikuAkce	0 (xsd:int)
http://linked.open...nichUcastnikuAkce	0 (xsd:int)
http://linked.open...UplatneniVysledku	2003
http://linked.open...v/svazekPeriodika	5195
http://linked.open...iv/tvurceVysledku	Baumbach, T. Ferrari, C. Korytár, D. Mikulík, Petr Helfen, L. Pernot, P. Lübbert, D. Verdi, N.
http://linked.open...n/vavai/riv/zamer	http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20143100002
number of pages	10 (xsd:int)
https://schema.org/isbn	0-8194-5068-5
http://localhost/t...ganizacniJednotka	14310

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