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  • In the present work variable energy positron annihilation spectroscopy (VEPAS) was employed for investigation of defects in Mg films. VEPAS characterization was combined with scanning electron microscopy and X-ray diffraction in order to determine grain size and texture respectively. The aim of this study was to examine the effect of deposition temperature and various substrates on structure and defects in Mg films prepared by RF magnetron sputtering. SEM observations revealed that films deposited on sapphire (0001) substrate exhibit always smaller grains than films deposited on amorphous fused silica and silicon (100) substrates, which have comparable grain size. Defect studies by VEPAS showed that positrons in Mg films studied are trapped at misfit dislocations and at vacancy-like defects in grain boundaries. Moreover, the films deposited on a substrate heated at 300 degrees C exhibited lower concentration of defects and larger grain size compared to the films deposited at room temperature. Subsequent annealing at 300 degrees C for 1 h of the films deposited at room temperature causes a slight decrease of defect density due to coarsening of grains.
  • In the present work variable energy positron annihilation spectroscopy (VEPAS) was employed for investigation of defects in Mg films. VEPAS characterization was combined with scanning electron microscopy and X-ray diffraction in order to determine grain size and texture respectively. The aim of this study was to examine the effect of deposition temperature and various substrates on structure and defects in Mg films prepared by RF magnetron sputtering. SEM observations revealed that films deposited on sapphire (0001) substrate exhibit always smaller grains than films deposited on amorphous fused silica and silicon (100) substrates, which have comparable grain size. Defect studies by VEPAS showed that positrons in Mg films studied are trapped at misfit dislocations and at vacancy-like defects in grain boundaries. Moreover, the films deposited on a substrate heated at 300 degrees C exhibited lower concentration of defects and larger grain size compared to the films deposited at room temperature. Subsequent annealing at 300 degrees C for 1 h of the films deposited at room temperature causes a slight decrease of defect density due to coarsening of grains. (en)
Title
  • Structural studies of thin Mg films
  • Structural studies of thin Mg films (en)
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  • Structural studies of thin Mg films
  • Structural studies of thin Mg films (en)
skos:notation
  • RIV/00216208:11320/14:10288287!RIV15-MSM-11320___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • I, P(GBP108/12/G043), S
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
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http://linked.open...dnocenehoVysledku
  • 47886
http://linked.open...ai/riv/idVysledku
  • RIV/00216208:11320/14:10288287
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • positron annihilation; Mg films (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [9109F8869E3B]
http://linked.open...v/mistoKonaniAkce
  • Munich
http://linked.open...i/riv/mistoVydani
  • BRISTOL
http://linked.open...i/riv/nazevZdroje
  • Journal of Physics: Conference Series
http://linked.open...in/vavai/riv/obor
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http://linked.open...iv/tvurceVysledku
  • Anwand, W.
  • Melikhova, Oksana
  • Procházka, Ivan
  • Čížek, Jakub
  • Hruška, Petr
  • Bulir, J.
  • Lancok, J.
  • Stráská, Jitka
http://linked.open...vavai/riv/typAkce
http://linked.open...ain/vavai/riv/wos
  • 000338216500024
http://linked.open.../riv/zahajeniAkce
issn
  • 1742-6588
number of pages
http://bibframe.org/vocab/doi
  • 10.1088/1742-6596/505/1/012024
http://purl.org/ne...btex#hasPublisher
  • IOP PUBLISHING LTD
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  • 11320
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