About: Evaluation of the mobility-lifetime product in CdTe and CdZnTe detectors by the transient-current technique     Goto   Sponge   NotDistinct   Permalink

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Description
  • New methods for evaluation of mobility-lifetime product (mu-tau) in polarized planar CdTe and CdZnTe detectors are presented. We combined the transient-current technique measurements with the measurements of the charge-collection efficiency and developed two iterative procedures for calculating mu-tau and mobility both taking into account the actual profile of the electric field in a detector. Their applicability is demonstrated on both the simulated and existing experimental data. The cases in which these methods are preferred to the common procedures based on the Hecht equation are widely discussed. We demonstrate that neglecting the detector's polarization can lead to underestimation of real mu-tau, thus negatively affecting the interpretation of particular measurements.
  • New methods for evaluation of mobility-lifetime product (mu-tau) in polarized planar CdTe and CdZnTe detectors are presented. We combined the transient-current technique measurements with the measurements of the charge-collection efficiency and developed two iterative procedures for calculating mu-tau and mobility both taking into account the actual profile of the electric field in a detector. Their applicability is demonstrated on both the simulated and existing experimental data. The cases in which these methods are preferred to the common procedures based on the Hecht equation are widely discussed. We demonstrate that neglecting the detector's polarization can lead to underestimation of real mu-tau, thus negatively affecting the interpretation of particular measurements. (en)
Title
  • Evaluation of the mobility-lifetime product in CdTe and CdZnTe detectors by the transient-current technique
  • Evaluation of the mobility-lifetime product in CdTe and CdZnTe detectors by the transient-current technique (en)
skos:prefLabel
  • Evaluation of the mobility-lifetime product in CdTe and CdZnTe detectors by the transient-current technique
  • Evaluation of the mobility-lifetime product in CdTe and CdZnTe detectors by the transient-current technique (en)
skos:notation
  • RIV/00216208:11320/13:10190127!RIV14-TA0-11320___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • I, P(GA13-13671S), P(TE01020445), S
http://linked.open...iv/cisloPeriodika
  • 9
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
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http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 73685
http://linked.open...ai/riv/idVysledku
  • RIV/00216208:11320/13:10190127
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • polarization; charge collection; nuclear-detectors; radiation detectors; electric-field (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [2B53BFB62FBF]
http://linked.open...i/riv/nazevZdroje
  • Journal of Applied Physics
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
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http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 114
http://linked.open...iv/tvurceVysledku
  • Belas, Eduard
  • Grill, Roman
  • Uxa, Štěpán
http://linked.open...ain/vavai/riv/wos
  • 000324386900075
issn
  • 0021-8979
number of pages
http://bibframe.org/vocab/doi
  • 10.1063/1.4819891
http://localhost/t...ganizacniJednotka
  • 11320
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