About: Determination of Electric-Field Profile in CdTe and CdZnTe Detectors Using Transient-Current Technique

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Attributes	Values
rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
rdfs:seeAlso	http://dx.doi.org/10.1109/TNS.2012.2211615
Description	Transient-current technique was used for measuring the profile of the electric field in CdTe and CdZnTe samples excited by an Am-241 alpha-particle source. Current waveforms were analyzed by a general model, which involved both the effect of the space charge in the depleted region and charge trapping. The carrier mobility and the electric-field profile were also evaluated in this way. The maximum electric field was observed close to the cathode, whereas the minimum occurred near the anode. The decrease in the strength of the electric field from cathode to anode was explained in terms of a positive space charge formed in the detector's volume. Measurements under incomplete depletion, when an %22inactive%22 region with zero electric field was observed under the anode, were reported as well. Space-charge densities of 10(11)-10(12) cm(-3) in CdTe and 10(10) cm(-3) in CdZnTe were evaluated. The dynamics of electron-hole plasma formed by a single alpha-particle absorption event was analyzed in detail and used as a complementary test of our reported model. An excellent agreement with theory was obtained. Transient-current technique was used for measuring the profile of the electric field in CdTe and CdZnTe samples excited by an Am-241 alpha-particle source. Current waveforms were analyzed by a general model, which involved both the effect of the space charge in the depleted region and charge trapping. The carrier mobility and the electric-field profile were also evaluated in this way. The maximum electric field was observed close to the cathode, whereas the minimum occurred near the anode. The decrease in the strength of the electric field from cathode to anode was explained in terms of a positive space charge formed in the detector's volume. Measurements under incomplete depletion, when an %22inactive%22 region with zero electric field was observed under the anode, were reported as well. Space-charge densities of 10(11)-10(12) cm(-3) in CdTe and 10(10) cm(-3) in CdZnTe were evaluated. The dynamics of electron-hole plasma formed by a single alpha-particle absorption event was analyzed in detail and used as a complementary test of our reported model. An excellent agreement with theory was obtained. (en)
Title	Determination of Electric-Field Profile in CdTe and CdZnTe Detectors Using Transient-Current Technique Determination of Electric-Field Profile in CdTe and CdZnTe Detectors Using Transient-Current Technique (en)
skos:prefLabel	Determination of Electric-Field Profile in CdTe and CdZnTe Detectors Using Transient-Current Technique Determination of Electric-Field Profile in CdTe and CdZnTe Detectors Using Transient-Current Technique (en)
skos:notation	RIV/00216208:11320/12:10127598!RIV13-GA0-11320___
http://linked.open...avai/riv/aktivita	I P S
http://linked.open...avai/riv/aktivity	I, P(GD102/09/H074), S
http://linked.open...iv/cisloPeriodika	5
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Praus, Petr Grill, Roman Belas, Eduard Uxa, Štěpán
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Univerzita Karlova v Praze / Matematicko-fyzikální fakulta
http://linked.open...dnocenehoVysledku	130577
http://linked.open...ai/riv/idVysledku	RIV/00216208:11320/12:10127598
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	time-of-flight measurement, transient-current technique; electric-field profile; CdZnTe; CdTe (en)
http://linked.open.../riv/klicoveSlovo	CdTe electric-field profile time-of-flight measurement transient-current technique CdZnTe
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[BC051FB1E6C0]
http://linked.open...i/riv/nazevZdroje	IEEE Transactions on Nuclear Science
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	Diagnostics of material defects using the latest defectoscopic methods
http://linked.open...UplatneniVysledku	2012
http://linked.open...v/svazekPeriodika	59
http://linked.open...iv/tvurceVysledku	Belas, Eduard Grill, Roman Praus, Petr James, Ralph B. Uxa, Štěpán
http://linked.open...ain/vavai/riv/wos	000310143400005
issn	0018-9499
number of pages	7 (xsd:int)
http://bibframe.org/vocab/doi	10.1109/TNS.2012.2211615
http://localhost/t...ganizacniJednotka	11320

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