About: X-ray interference effects on the determination of structural data in ultrathin La(2/3)Sr(1/3)MnO(3) epitaxial thin films     Goto   Sponge   NotDistinct   Permalink

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Description
  • We analyze x-ray diffraction data to extract cell parameters of ultrathin films on closely matching substrates. We focus on epitaxial La2/3Sr1/3MnO3 films grown on (001) SrTiO3 single crystalline substrates. It will be shown that, due to extremely high structural similarity of film and substrate, the data analysis must explicitly consider the distinct phase of the diffracted waves by substrate and films to extract reliable unit cell parameters. The implications of this finding for the understanding of strain effects in ultrathin films and interfaces will be underlined.
  • We analyze x-ray diffraction data to extract cell parameters of ultrathin films on closely matching substrates. We focus on epitaxial La2/3Sr1/3MnO3 films grown on (001) SrTiO3 single crystalline substrates. It will be shown that, due to extremely high structural similarity of film and substrate, the data analysis must explicitly consider the distinct phase of the diffracted waves by substrate and films to extract reliable unit cell parameters. The implications of this finding for the understanding of strain effects in ultrathin films and interfaces will be underlined. (en)
Title
  • X-ray interference effects on the determination of structural data in ultrathin La(2/3)Sr(1/3)MnO(3) epitaxial thin films
  • X-ray interference effects on the determination of structural data in ultrathin La(2/3)Sr(1/3)MnO(3) epitaxial thin films (en)
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  • X-ray interference effects on the determination of structural data in ultrathin La(2/3)Sr(1/3)MnO(3) epitaxial thin films
  • X-ray interference effects on the determination of structural data in ultrathin La(2/3)Sr(1/3)MnO(3) epitaxial thin films (en)
skos:notation
  • RIV/00216208:11320/11:10105925!RIV13-MSM-11320___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • Z(MSM0021620834)
http://linked.open...iv/cisloPeriodika
  • 22
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 241992
http://linked.open...ai/riv/idVysledku
  • RIV/00216208:11320/11:10105925
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • films; thin; epitaxial; La2/3Sr1/3MnO3; ultrathin; data; structural; determination; effects; interference; X-ray (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [1F80300D849B]
http://linked.open...i/riv/nazevZdroje
  • Applied Physics Letters
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 99
http://linked.open...iv/tvurceVysledku
  • Martí, Xavier
  • Holý, Václav
  • Fontcuberta, J.
  • Bachelet, R.
  • Herranz, G.
  • Pesquera, D.
http://linked.open...ain/vavai/riv/wos
  • 000298244500016
http://linked.open...n/vavai/riv/zamer
issn
  • 0003-6951
number of pages
http://bibframe.org/vocab/doi
  • 10.1063/1.3663574
http://localhost/t...ganizacniJednotka
  • 11320
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