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  • The interaction of Pt with CeO2 in Pt-doped cerium oxide layers deposited on a Si wafer at normal and grazing incidence, and on multiwall carbon nanotubes (MWCNTs), was investigated by using X-ray photoelectron spectroscopy (XPS). 30-nm-thick Pt-doped CeO2 layers were deposited by rf-magnetron sputtering of a composite CeO2 - Pt target. XPS showed formation of cerium oxide with completely ionized species Pt-2+,Pt-4+ embedded in the film. The Pt2+/Pt4+ ratio depends on the deposition angle and increases in the case of the film deposition on the MWCNTs. This behavior was explained by the dependence of the polycrystalline film grain morphology on a deposition angle.
  • The interaction of Pt with CeO2 in Pt-doped cerium oxide layers deposited on a Si wafer at normal and grazing incidence, and on multiwall carbon nanotubes (MWCNTs), was investigated by using X-ray photoelectron spectroscopy (XPS). 30-nm-thick Pt-doped CeO2 layers were deposited by rf-magnetron sputtering of a composite CeO2 - Pt target. XPS showed formation of cerium oxide with completely ionized species Pt-2+,Pt-4+ embedded in the film. The Pt2+/Pt4+ ratio depends on the deposition angle and increases in the case of the film deposition on the MWCNTs. This behavior was explained by the dependence of the polycrystalline film grain morphology on a deposition angle. (en)
Title
  • Pt2+,4+ ions in CeO2 rf-sputtered thin films
  • Pt2+,4+ ions in CeO2 rf-sputtered thin films (en)
skos:prefLabel
  • Pt2+,4+ ions in CeO2 rf-sputtered thin films
  • Pt2+,4+ ions in CeO2 rf-sputtered thin films (en)
skos:notation
  • RIV/00216208:11320/10:10070061!RIV11-GA0-11320___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA202/07/0782), P(GD202/09/H041), P(ME08056), S, Z(MSM0021620834)
http://linked.open...iv/cisloPeriodika
  • 6-7
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 283438
http://linked.open...ai/riv/idVysledku
  • RIV/00216208:11320/10:10070061
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • platinum; cerium oxide; carbon nanotubes; photoelectron spectroscopy (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [99D5F3D92E92]
http://linked.open...i/riv/nazevZdroje
  • Surface and Interface Analysis
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 42
http://linked.open...iv/tvurceVysledku
  • Matolín, Vladimír
  • Matolínová, Iva
  • Vorokhta, Mykhailo
  • Veltruská, Kateřina
  • Khalakhan, Ivan
  • Václavů, Michal
http://linked.open...ain/vavai/riv/wos
  • 000281149700094
http://linked.open...n/vavai/riv/zamer
issn
  • 0142-2421
number of pages
http://localhost/t...ganizacniJednotka
  • 11320
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