About: Scanner configuration suitable for both Zener reference standards comparisons and JVS measurements

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In this paper configurations of national standards of DC voltage often used in National metrological institutes are discussed. The typical configurations of scanner used for comparing voltages of bank of Zener reference standards and for Josephson voltage systems are described. Both systems are often used in laboratories of national rnetrological institutes. This leads to duplication of nanovoltmeters in a laboratory or often change of connecting wires. New scanner configuration used for the connection of the bank of Zener reference standards and Josephson voltage system together is presented. The advantage is the necessity of only one nanovoltmeter and the fixed configuration without the need of changing the wires for the current ongoing measurement. The drawback is that offsets of the scanner influence the Josephson voltage system measurements. This configuration was already tested in Czech Metrology Institute. Scanner offsets have been measured by means of two methods: by replacing the Zener reference standard with short and by using Zener reference standard as a test device. Results showed that the offsets were small enough compared to the noise of the Zener reference standard. Also stability of offsets was measured and was found sufficient. Therefore the new configuration is suitable for everyday measurements at national standard of DC voltage. In this paper configurations of national standards of DC voltage often used in National metrological institutes are discussed. The typical configurations of scanner used for comparing voltages of bank of Zener reference standards and for Josephson voltage systems are described. Both systems are often used in laboratories of national rnetrological institutes. This leads to duplication of nanovoltmeters in a laboratory or often change of connecting wires. New scanner configuration used for the connection of the bank of Zener reference standards and Josephson voltage system together is presented. The advantage is the necessity of only one nanovoltmeter and the fixed configuration without the need of changing the wires for the current ongoing measurement. The drawback is that offsets of the scanner influence the Josephson voltage system measurements. This configuration was already tested in Czech Metrology Institute. Scanner offsets have been measured by means of two methods: by replacing the Zener reference standard with short and by using Zener reference standard as a test device. Results showed that the offsets were small enough compared to the noise of the Zener reference standard. Also stability of offsets was measured and was found sufficient. Therefore the new configuration is suitable for everyday measurements at national standard of DC voltage. (en)
Title	Scanner configuration suitable for both Zener reference standards comparisons and JVS measurements Scanner configuration suitable for both Zener reference standards comparisons and JVS measurements (en)
skos:prefLabel	Scanner configuration suitable for both Zener reference standards comparisons and JVS measurements Scanner configuration suitable for both Zener reference standards comparisons and JVS measurements (en)
skos:notation	RIV/00177016:_____/11:#0000364!RIV12-MPO-00177016
http://linked.open...avai/riv/aktivita	V
http://linked.open...avai/riv/aktivity	V
http://linked.open...iv/cisloPeriodika	2011
http://linked.open...vai/riv/dodaniDat	2012
http://linked.open...aciTvurceVysledku	Nováková Zachovalová, Věra Šíra, Martin Streit, Jiří
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Český metrologický institut
http://linked.open...dnocenehoVysledku	228210
http://linked.open...ai/riv/idVysledku	RIV/00177016:_____/11:#0000364
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	JOSEPHSON VOLTAGE STANDARD; ZENER STANDARD; COMPARISONS (en)
http://linked.open.../riv/klicoveSlovo	COMPARISONS JOSEPHSON VOLTAGE STANDARD ZENER STANDARD
http://linked.open...odStatuVydavatele	PL - Polská republika
http://linked.open...ontrolniKodProRIV	[4A584BA4B9E1]
http://linked.open...i/riv/nazevZdroje	Elektronika
http://linked.open...in/vavai/riv/obor	JB
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...UplatneniVysledku	2011
http://linked.open...v/svazekPeriodika	6
http://linked.open...iv/tvurceVysledku	Nováková Zachovalová, Věra Streit, Jiří Šíra, Martin
issn	0033-2089
number of pages	3 (xsd:int)

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