About: Inﬂuence of the atomic force microscope tip on the multifractal analysis of rough surfaces

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About: Inﬂuence of the atomic force microscope tip on the multifractal analysis of rough surfaces Goto Sponge NotDistinct Permalink

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In this paper, the inﬂuence of atomic force microscope tip on the multifractal analysis of rough surfaces is discussed. This analysis is based on two methods, i.e. on the correlation function method and the wavelet transform modulus maxima method. The principles of both methods are brieﬂy described. Both methods are applied to simulated rough surfaces (simulation is performed by the spectral synthesis method). It is shown that the ﬁnite dimensions of the microscope tip misrepresent the values of the quantities expressing the multifractal analysis of rough surfaces within both the methods. Thus, it was concretely shown that the inﬂuence of the ﬁnite dimensions of the microscope tip changed mono-fractal properties of simulated rough surface to multifractal ones. Further, it is shown that a surface reconstruction method developed for removing the negative inﬂuence of the microscope tip does not improve the results obtained in a substantial way. In this paper, the inﬂuence of atomic force microscope tip on the multifractal analysis of rough surfaces is discussed. This analysis is based on two methods, i.e. on the correlation function method and the wavelet transform modulus maxima method. The principles of both methods are brieﬂy described. Both methods are applied to simulated rough surfaces (simulation is performed by the spectral synthesis method). It is shown that the ﬁnite dimensions of the microscope tip misrepresent the values of the quantities expressing the multifractal analysis of rough surfaces within both the methods. Thus, it was concretely shown that the inﬂuence of the ﬁnite dimensions of the microscope tip changed mono-fractal properties of simulated rough surface to multifractal ones. Further, it is shown that a surface reconstruction method developed for removing the negative inﬂuence of the microscope tip does not improve the results obtained in a substantial way. (en)
Title	Inﬂuence of the atomic force microscope tip on the multifractal analysis of rough surfaces Inﬂuence of the atomic force microscope tip on the multifractal analysis of rough surfaces (en)
skos:prefLabel	Inﬂuence of the atomic force microscope tip on the multifractal analysis of rough surfaces Inﬂuence of the atomic force microscope tip on the multifractal analysis of rough surfaces (en)
skos:notation	RIV/00177016:_____/04:#0000325!RIV11-GA0-00177016
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(GA101/01/1104), P(GA202/01/1110)
http://linked.open...iv/cisloPeriodika	2
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Klapetek, Petr
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Český metrologický institut
http://linked.open...dnocenehoVysledku	568838
http://linked.open...ai/riv/idVysledku	RIV/00177016:_____/04:#0000325
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	AFM (en)
http://linked.open.../riv/klicoveSlovo	AFM
http://linked.open...odStatuVydavatele	NL - Nizozemsko
http://linked.open...ontrolniKodProRIV	[64F24AE88358]
http://linked.open...i/riv/nazevZdroje	Ultramicroscopy
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	3 (xsd:int)
http://linked.open...vavai/riv/projekt	Optical and mechanical properties of DLC : Si thin films prepared by the PECVD method Realisation of thelaboratory instrument for surface roughness measurement by holographic interferometry
http://linked.open...UplatneniVysledku	2004
http://linked.open...v/svazekPeriodika	102
http://linked.open...iv/tvurceVysledku	Klapetek, Petr Ohlídal, I. Bílek, J.
issn	0304-3991
number of pages	8 (xsd:int)

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