About: Atomic Force Microscopy Characterization of ZnTe Epitaxial Thin Films

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	In this paper, results concerning atomic force microscopy studies of the upper boundaries of ZnTe epitaxial thin ﬁlms prepared by molecular beam epitaxy onto gallium arsenide single crystal substrates are presented. It is shown that the upper boundaries of these ﬁlms contain grains forming a faceted structure. This faceted structure is quantitatively described by the four statistical quantities: root mean square values of the heights of the irregularities, power spectral density function (PSDF), diagram describing the distribution of the directions of the normals to the boundaries and one-dimensional distribution of the heights of the irregularities. The grain structure is quantitatively described by two quantities: mean grain size and grain size distribution. In this paper, results concerning atomic force microscopy studies of the upper boundaries of ZnTe epitaxial thin ﬁlms prepared by molecular beam epitaxy onto gallium arsenide single crystal substrates are presented. It is shown that the upper boundaries of these ﬁlms contain grains forming a faceted structure. This faceted structure is quantitatively described by the four statistical quantities: root mean square values of the heights of the irregularities, power spectral density function (PSDF), diagram describing the distribution of the directions of the normals to the boundaries and one-dimensional distribution of the heights of the irregularities. The grain structure is quantitatively described by two quantities: mean grain size and grain size distribution. (en)
Title	Atomic Force Microscopy Characterization of ZnTe Epitaxial Thin Films Atomic Force Microscopy Characterization of ZnTe Epitaxial Thin Films (en)
skos:prefLabel	Atomic Force Microscopy Characterization of ZnTe Epitaxial Thin Films Atomic Force Microscopy Characterization of ZnTe Epitaxial Thin Films (en)
skos:notation	RIV/00177016:_____/03:#0000323!RIV11-GA0-00177016
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(GA101/01/1104), P(GA202/01/1110)
http://linked.open...iv/cisloPeriodika	1
http://linked.open...vai/riv/dodaniDat	2011
http://linked.open...aciTvurceVysledku	Klapetek, Petr
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Český metrologický institut
http://linked.open...dnocenehoVysledku	599265
http://linked.open...ai/riv/idVysledku	RIV/00177016:_____/03:#0000323
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	AFM (en)
http://linked.open.../riv/klicoveSlovo	AFM
http://linked.open...odStatuVydavatele	JP - Japonsko
http://linked.open...ontrolniKodProRIV	[C240B20074BB]
http://linked.open...i/riv/nazevZdroje	Japanese Journal of Applied Physics
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	6 (xsd:int)
http://linked.open...vavai/riv/projekt	Optical and mechanical properties of DLC : Si thin films prepared by the PECVD method Realisation of thelaboratory instrument for surface roughness measurement by holographic interferometry
http://linked.open...UplatneniVysledku	2003
http://linked.open...v/svazekPeriodika	42
http://linked.open...iv/tvurceVysledku	Klapetek, Petr Ohlídal, I. Bonnanni, A. Montaigne-Ramil, A. Sitter, H. Stifter, D.
issn	0021-4922
number of pages	3 (xsd:int)

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