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Description
  • We propose in this paper a technique for emulating standard inductors with a tee network of two resistors and capacitor and with buffer in feedback circuit. Unwanted impedances to ground of the emulating tee network may be canceled by introducing a buffer. We anticipate that inductors for values higher than 1 H can be emulated with accuracy of least 0.01%.
  • We propose in this paper a technique for emulating standard inductors with a tee network of two resistors and capacitor and with buffer in feedback circuit. Unwanted impedances to ground of the emulating tee network may be canceled by introducing a buffer. We anticipate that inductors for values higher than 1 H can be emulated with accuracy of least 0.01%. (en)
Title
  • Simulated inductance standard
  • Simulated inductance standard (en)
skos:prefLabel
  • Simulated inductance standard
  • Simulated inductance standard (en)
skos:notation
  • RIV/00177016:_____/02:#0000256!RIV11-MPO-00177016
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • R
http://linked.open...vai/riv/dodaniDat
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http://linked.open...iv/duvernostUdaju
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http://linked.open...dnocenehoVysledku
  • 663586
http://linked.open...ai/riv/idVysledku
  • RIV/00177016:_____/02:#0000256
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • inductance standard; simulation (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [EA3713BE0CDC]
http://linked.open...v/mistoKonaniAkce
  • Ottawa, Canada
http://linked.open...i/riv/mistoVydani
  • Ottawa, Canada
http://linked.open...i/riv/nazevZdroje
  • Conference on Precision Electromagnetic Measurements Digest
http://linked.open...in/vavai/riv/obor
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http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Horská, Jana
  • Horský, Jiří
http://linked.open...vavai/riv/typAkce
http://linked.open.../riv/zahajeniAkce
number of pages
http://purl.org/ne...btex#hasPublisher
  • IEEE, 345 E 47th St., New York, NY 10017 USA
https://schema.org/isbn
  • 0-7803-7242-5
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