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rdf:type
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Description
| - In situ focus characterization is demonstrated by working at an extreme ultraviolet (XUV) free-electron laser source using ablation technique. Design of the instrument reported here allows reaching a few micrometres resolution along with keeping the ultrahigh vacuum conditions and ensures high-contrast visibility of ablative imprints on optically transparent samples, e.g., PMMA. This enables on-line monitoring of the beam profile changes and thus makes possible in situ alignment of the XUV focusing optics. A good agreement between focal characterizations retrieved from in situ inspection of ablative imprints contours and from well-established accurate ex situ analysis with Nomarski microscope has been observed for a typical micro-focus experiment.
- In situ focus characterization is demonstrated by working at an extreme ultraviolet (XUV) free-electron laser source using ablation technique. Design of the instrument reported here allows reaching a few micrometres resolution along with keeping the ultrahigh vacuum conditions and ensures high-contrast visibility of ablative imprints on optically transparent samples, e.g., PMMA. This enables on-line monitoring of the beam profile changes and thus makes possible in situ alignment of the XUV focusing optics. A good agreement between focal characterizations retrieved from in situ inspection of ablative imprints contours and from well-established accurate ex situ analysis with Nomarski microscope has been observed for a typical micro-focus experiment. (en)
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Title
| - In situ focus characterization by ablation technique to enable optics alignment at an XUV FEL source
- In situ focus characterization by ablation technique to enable optics alignment at an XUV FEL source (en)
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skos:prefLabel
| - In situ focus characterization by ablation technique to enable optics alignment at an XUV FEL source
- In situ focus characterization by ablation technique to enable optics alignment at an XUV FEL source (en)
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skos:notation
| - RIV/68378271:_____/13:00395140!RIV14-MSM-68378271
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - I, P(ED1.1.00/02.0061), P(EE.2.3.20.0087), P(EE2.3.30.0057), P(GA13-28721S), P(GAP108/11/1312), P(GAP205/11/0571), P(GAP208/10/2302), P(LG13029)
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/68378271:_____/13:00395140
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - free electron lasers; laser ablation; laser beams; optical focusing; ultraviolet sources (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
| - US - Spojené státy americké
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
| - Review of Scientific Instruments
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
| - Chalupský, Jaromír
- Hájková, Věra
- Juha, Libor
- Vyšín, Luděk
- Dziarzhytski, S.
- Gerasimova, N.
- Weigelt, H.
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http://linked.open...ain/vavai/riv/wos
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issn
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number of pages
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http://bibframe.org/vocab/doi
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