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rdf:type
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Description
| - Secondary and backscattered electron images have revealed surface patterns in the In0.2Ga0.8As/GaAs quantum well structures that correlate with places of an enhanced charge collection as measured by the electron beam induced current method. These inhomogenities can suppress transient response expected in capacitance measurements
- Secondary and backscattered electron images have revealed surface patterns in the In0.2Ga0.8As/GaAs quantum well structures that correlate with places of an enhanced charge collection as measured by the electron beam induced current method. These inhomogenities can suppress transient response expected in capacitance measurements (en)
- Zobrazení struktury In0.2Ga0.8As/GaAs s kvantovou jamou pomocí sekundárních a zpětně rozptýlených elektronů ukazuje povtchové struktury, které korelují s oblastmi zvýšeného sběru náboje měřeného metodou proudů indukovaných elektronovým svazkem. Tyto nehomogenity mohou potlačovat přechodové jevy očekávané v kapacitních měřeních (cs)
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Title
| - Nanostructure in In0.2Ga0.8As/GaAs quantum well structure
- Nanostructure in In0.2Ga0.8As/GaAs quantum well structure (en)
- Nanostruktura In0.2Ga0.8As/GaAs s kvantovou jámou (cs)
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skos:prefLabel
| - Nanostructure in In0.2Ga0.8As/GaAs quantum well structure
- Nanostructure in In0.2Ga0.8As/GaAs quantum well structure (en)
- Nanostruktura In0.2Ga0.8As/GaAs s kvantovou jámou (cs)
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skos:notation
| - RIV/68378271:_____/05:00020690!RIV06-AV0-68378271
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http://linked.open.../vavai/riv/strany
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(GA202/03/0410), P(IAA1010318), P(IAA1010404), Z(AV0Z10100521)
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/68378271:_____/05:00020690
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - InGaAs/GaAs; quantum well; electron microscopy; EBIC; capacitance transients (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...ontrolniKodProRIV
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http://linked.open...v/mistoKonaniAkce
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http://linked.open...i/riv/mistoVydani
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http://linked.open...i/riv/nazevZdroje
| - Hungarian Nanotechnology Symposium 2005 HUNS2005
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...iv/tvurceVysledku
| - Hulicius, Eduard
- Hubík, Pavel
- Tóth, A. L.
- Dózsa, L.
- Koós, A. A.
- Pongracz, A.
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http://linked.open...vavai/riv/typAkce
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http://linked.open.../riv/zahajeniAkce
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http://linked.open...n/vavai/riv/zamer
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number of pages
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http://purl.org/ne...btex#hasPublisher
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https://schema.org/isbn
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