About: Dimple phenomena study by dichromatic colorimetric interferometry

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	This study presents such a modification of colorimetric interferometry technique using dichromatic light source instead of white light and new refractive index correction algorithm combining Lorenz-Lorentz equation with density pressure equation and pressure distribution calculated from measured film thickness map. The efficiency of this technique has been tested through the observation of EHD film shapes under disc sliding conditions when a deep conical depression (dimple) appears within the contact area. Obtained results have proved that with the use of dichromatic colorimetric interferometry it is possible to obtain precise EHD film shapes for film thicknesses up to 1 500 nm with film thickness resolution approx. 1 nm and measurement accuracy 3 nm. This study presents such a modification of colorimetric interferometry technique using dichromatic light source instead of white light and new refractive index correction algorithm combining Lorenz-Lorentz equation with density pressure equation and pressure distribution calculated from measured film thickness map. The efficiency of this technique has been tested through the observation of EHD film shapes under disc sliding conditions when a deep conical depression (dimple) appears within the contact area. Obtained results have proved that with the use of dichromatic colorimetric interferometry it is possible to obtain precise EHD film shapes for film thicknesses up to 1 500 nm with film thickness resolution approx. 1 nm and measurement accuracy 3 nm. (en)
Title	Dimple phenomena study by dichromatic colorimetric interferometry Dimple phenomena study by dichromatic colorimetric interferometry (en)
skos:prefLabel	Dimple phenomena study by dichromatic colorimetric interferometry Dimple phenomena study by dichromatic colorimetric interferometry (en)
skos:notation	RIV/00216305:26210/00:00000107!RIV/2001/MSM/262101/N
http://linked.open.../vavai/riv/strany	982.543945
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(ME 182), Z(MSM 262100002)
http://linked.open...vai/riv/dodaniDat	2001
http://linked.open...aciTvurceVysledku	Hartl, Martin Křupka, Ivan Liška, Miroslav Poliščuk, Radek
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Vysoké učení technické v Brně / Fakulta strojního inženýrství
http://linked.open...dnocenehoVysledku	708846
http://linked.open...ai/riv/idVysledku	RIV/00216305:26210/00:00000107
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	dimple phenomena; colorimetry; film thickness (en)
http://linked.open.../riv/klicoveSlovo	colorimetry film thickness dimple phenomena
http://linked.open...ontrolniKodProRIV	[B4BE70B48AC3]
http://linked.open...i/riv/mistoVydani	Nagasaki, Japan
http://linked.open...i/riv/nazevZdroje	International Tribology Conference ITC Nagasaki 2000
http://linked.open...in/vavai/riv/obor	JR
http://linked.open...ichTvurcuVysledku	4 (xsd:int)
http://linked.open...cetTvurcuVysledku	7 (xsd:int)
http://linked.open...vavai/riv/projekt	http://linked.opendata.cz/resource/domain/vavai/projekt/ME%20182
http://linked.open...UplatneniVysledku	2000
http://linked.open...iv/tvurceVysledku	Hartl, Martin Křupka, Ivan Liška, Miroslav Poliščuk, Radek Kaneta, Motohiro Matsuda, Kenji Nishikawa, Humisex
http://linked.open...n/vavai/riv/zamer	http://linked.opendata.cz/resource/domain/vavai/zamer/MSM%20262100002
number of pages	1 (xsd:int)
http://purl.org/ne...btex#hasPublisher	Japanese Society of Tribologists
http://localhost/t...ganizacniJednotka	26210

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