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rdf:type
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Description
| - Ultra-thin films of 57Fe deposited on silicon substrates and SiOxCyHz support layers and subsequently oxidized in laboratory atmosphere are studied by two optical methods: the combination of UV/VIS/NIR spectroscopic ellipsometry and spectrophotometry, used to find layer thicknesses and optical constants, and X-ray specular reflectometry, used to obtain the electron density depth profile. The results of both methods are compared and found to be in a relatively good agreement.
- Ultra-thin films of 57Fe deposited on silicon substrates and SiOxCyHz support layers and subsequently oxidized in laboratory atmosphere are studied by two optical methods: the combination of UV/VIS/NIR spectroscopic ellipsometry and spectrophotometry, used to find layer thicknesses and optical constants, and X-ray specular reflectometry, used to obtain the electron density depth profile. The results of both methods are compared and found to be in a relatively good agreement. (en)
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Title
| - Optical Characterization of Ultra-Thin Iron and Iron Oxide Films
- Optical Characterization of Ultra-Thin Iron and Iron Oxide Films (en)
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skos:prefLabel
| - Optical Characterization of Ultra-Thin Iron and Iron Oxide Films
- Optical Characterization of Ultra-Thin Iron and Iron Oxide Films (en)
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skos:notation
| - RIV/00216224:14310/09:00028505!RIV10-MSM-14310___
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(KAN311610701), Z(MSM0021622410), Z(MSM0021622411)
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/00216224:14310/09:00028505
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - iron; iron oxide; thin films; ellipsometry; spectrophotometry; X-ray reflection (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
| - e-Journal of Surface Science and Nanotechnology
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
| - Franta, Daniel
- Nečas, David
- Valtr, Miroslav
- Zajíčková, Lenka
- Sťahel, Pavel
- Meduňa, Mojmír
- Mikulík, Petr
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http://linked.open...n/vavai/riv/zamer
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issn
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number of pages
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http://localhost/t...ganizacniJednotka
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