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  • Spektroskopie ztrát energie elektronů (REELS) je pro nízké energie velmi povrchově citlivá a může být použita k charakterizaci elektronových vlastností ultratenkých vrstev a nanostruktur na površích. Abychom získali spolehlivé kvantitativní informace z naměřených REELS spekter, musíme použít přesný teoretický algoritmus. V tomto článku ověřujeme platnost teoretické metody navržené Yuberem a Tougaardem k určení dielektrické funkce. (cs)
  • Reflection electron energy-loss spectroscopy (REELS) at low energies is very surface sensitive and can be used to characterize the electronic properties of ultrathin films and surface nanostructures. To extract reliable quantitative information from a REELS experiment it is essential to have accurate theoretical algorithms. In this paper, we have studied the validity of a theoretical method proposed by Yubero and Tougaard to determine the dielectric function.
  • Reflection electron energy-loss spectroscopy (REELS) at low energies is very surface sensitive and can be used to characterize the electronic properties of ultrathin films and surface nanostructures. To extract reliable quantitative information from a REELS experiment it is essential to have accurate theoretical algorithms. In this paper, we have studied the validity of a theoretical method proposed by Yubero and Tougaard to determine the dielectric function. (en)
Title
  • Validity of Yubero-Tougaard theory to quantitatively determine the dielectric properties of surface nanofilms
  • Platnost teorie Yubera a Tougaarda pro kvantitativní stanovení dielektrických vlastností povrchových vrstev nanometrických rozměrů (cs)
  • Validity of Yubero-Tougaard theory to quantitatively determine the dielectric properties of surface nanofilms (en)
skos:prefLabel
  • Validity of Yubero-Tougaard theory to quantitatively determine the dielectric properties of surface nanofilms
  • Platnost teorie Yubera a Tougaarda pro kvantitativní stanovení dielektrických vlastností povrchových vrstev nanometrických rozměrů (cs)
  • Validity of Yubero-Tougaard theory to quantitatively determine the dielectric properties of surface nanofilms (en)
skos:notation
  • RIV/68378271:_____/08:00312426!RIV09-AV0-68378271
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(GA202/06/0459), Z(AV0Z10100521)
http://linked.open...iv/cisloPeriodika
  • 15
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 402235
http://linked.open...ai/riv/idVysledku
  • RIV/68378271:_____/08:00312426
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • REELS; Yubero-Tougaard theory; dielectric function; nanofilms (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • US - Spojené státy americké
http://linked.open...ontrolniKodProRIV
  • [B387AAE94970]
http://linked.open...i/riv/nazevZdroje
  • Physical Review. B
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 77
http://linked.open...iv/tvurceVysledku
  • Romanyuk, Olexandr
  • Tougaard, S.
  • Zemek, Josef
  • Hajati, S.
http://linked.open...ain/vavai/riv/wos
  • 000255457400101
http://linked.open...n/vavai/riv/zamer
issn
  • 1098-0121
number of pages
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