About: Real topography, atomic relaxations and short-range chemical interactions in atomic force microscopy: the case of the -Sn/Si(111)-(3 x 3) R30 surface,

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About: Real topography, atomic relaxations and short-range chemical interactions in atomic force microscopy: the case of the -Sn/Si(111)-(3 x 3) R30 surface, Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Spolehlivé měření spektroskopie sil při pokojové teplotě s užitím metody „atom-tracking“ a výpočty z prvních principů poskytují vysvětlení pro indukovanou změnu korugace na čisté fázi díky různé síle krátkodosahové chemické interakce a hrotem indukované atomární relaxace. (cs) Reliable room-temperature force spectroscopic measurements using the atom-tracking technique and first-principles calculations provide an explanation for these striking induced hight variations on the pure phase in terms of both the different strength of the short-range chemical interaction and tip-induced atomic relaxations. Reliable room-temperature force spectroscopic measurements using the atom-tracking technique and first-principles calculations provide an explanation for these striking induced hight variations on the pure phase in terms of both the different strength of the short-range chemical interaction and tip-induced atomic relaxations. (en)
Title	Real topography, atomic relaxations and short-range chemical interactions in atomic force microscopy: the case of the -Sn/Si(111)-(3 x 3) R30 surface, Reálná topografie, atomární relaxace a krátkodosahové chemické interakce v mikroskopu atomárních sil: povrch -Sn/Si(111)-(3 x 3) R30 (cs) Real topography, atomic relaxations and short-range chemical interactions in atomic force microscopy: the case of the -Sn/Si(111)-(3 x 3) R30 surface, (en)
skos:prefLabel	Real topography, atomic relaxations and short-range chemical interactions in atomic force microscopy: the case of the -Sn/Si(111)-(3 x 3) R30 surface, Reálná topografie, atomární relaxace a krátkodosahové chemické interakce v mikroskopu atomárních sil: povrch -Sn/Si(111)-(3 x 3) R30 (cs) Real topography, atomic relaxations and short-range chemical interactions in atomic force microscopy: the case of the -Sn/Si(111)-(3 x 3) R30 surface, (en)
skos:notation	RIV/68378271:_____/06:00041140!RIV07-MSM-68378271
http://linked.open.../vavai/riv/strany	205329/1;205329/9
http://linked.open...avai/riv/aktivita	P
http://linked.open...avai/riv/aktivity	P(1K05020)
http://linked.open...iv/cisloPeriodika	20
http://linked.open...vai/riv/dodaniDat	2007
http://linked.open...aciTvurceVysledku	Jelínek, Pavel
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	496522
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/06:00041140
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	AFM; force spectroscopy; first principles simulations (en)
http://linked.open.../riv/klicoveSlovo	AFM first principles simulations force spectroscopy
http://linked.open...odStatuVydavatele	US - Spojené státy americké
http://linked.open...ontrolniKodProRIV	[458657A362DC]
http://linked.open...i/riv/nazevZdroje	Physical Review. B
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	7 (xsd:int)
http://linked.open...vavai/riv/projekt	Ab inito study of electrical and mechanical properties of nanosystems.
http://linked.open...UplatneniVysledku	2006
http://linked.open...v/svazekPeriodika	73
http://linked.open...iv/tvurceVysledku	Jelínek, Pavel Pou, P. Pérez, R. Abe, M. Morita, S. Sugimoto, Y. Custance, Ó.
issn	1098-0121
number of pages	9 (xsd:int)
is http://linked.open...avai/riv/vysledek of	Real topography, atomic relaxations and short-range chemical interactions in atomic force microscopy: the case of the -Sn/Si(111)-(3 x 3) R30 surface, Real topography, atomic relaxations and short-range chemical interactions in atomic force microscopy: the case of the -Sn/Si(111)-(3 x 3) R30 surface,

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