About: Optical refraction index and polarization profile of ferroelectric thin films.

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About: Optical refraction index and polarization profile of ferroelectric thin films. Goto Sponge NotDistinct Permalink

An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Analytical calculations of polarization and optical refraction index in ferroelectric thin films are performed in the framework of thermodynamic theory. The thickness dependence of the optical refraction index was found to be proportional to squared polarization. Analytical calculations of polarization and optical refraction index in ferroelectric thin films are performed in the framework of thermodynamic theory. The thickness dependence of the optical refraction index was found to be proportional to squared polarization. (en)
Title	Optical refraction index and polarization profile of ferroelectric thin films. Optical refraction index and polarization profile of ferroelectric thin films. (en)
skos:prefLabel	Optical refraction index and polarization profile of ferroelectric thin films. Optical refraction index and polarization profile of ferroelectric thin films. (en)
skos:notation	RIV/68378271:_____/01:02020047!RIV/2003/AV0/A02003/N
http://linked.open.../vavai/riv/strany	101;110
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA202/00/1425), P(LN00A015), Z(AV0Z1010914)
http://linked.open...iv/cisloPeriodika	1-4
http://linked.open...vai/riv/dodaniDat	2003
http://linked.open...aciTvurceVysledku	Jastrabík, Lubomír Hrabovský, Milan Deineka, Alexander
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	690205
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/01:02020047
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	thin film; - refraction index; - polarization; film thickness (en)
http://linked.open.../riv/klicoveSlovo	thin film - polarization - refraction index film thickness
http://linked.open...odStatuVydavatele	GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV	[8BFCC57F63CB]
http://linked.open...i/riv/nazevZdroje	Integrated Ferroelectrics
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	3 (xsd:int)
http://linked.open...cetTvurcuVysledku	8 (xsd:int)
http://linked.open...ocetUcastnikuAkce	0 (xsd:int)
http://linked.open...nichUcastnikuAkce	0 (xsd:int)
http://linked.open...vavai/riv/projekt	Research center for optics Spectroscopy and novel phenomena in complex-doped perovskite-like materials
http://linked.open...UplatneniVysledku	2001
http://linked.open...v/svazekPeriodika	38
http://linked.open...iv/tvurceVysledku	Hrabovský, Miroslav Jastrabík, Lubomír Gerlach, G. Suchaneck, G. Glinchuk, M. D. Deineka, Alexander Eliseev, E. A. Sandner, T.
http://linked.open...n/vavai/riv/zamer	Experimentální a teoretický výzkum kondenzovaných systémů s význačnými fyzikálními vlastnostmi
issn	1058-4587
number of pages	10 (xsd:int)

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