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  • Change of electronic structure and chemical composition on the surface of freshly prepared As35S65 thin films caused by electron- and light irradiation have been studied by high-resolution X-ray photoelectron spectroscopy. The mechanisms of the induced transformations are compared. It is shown that light irradiation causes redistribution of chemical bonds without change in chemical composition. The products of such lightinduced structural transformations were also identified by Raman spectroscopy in the volume of thin films. Electron irradiation changes chemical composition of the surface by creating an As-enriched layer due to the formation of As?O bonds. Anomalous increase of the ~10 eV band associated with non-bonding As 4s electrons was observed after light- and low dose e-beam irradiation.
  • Change of electronic structure and chemical composition on the surface of freshly prepared As35S65 thin films caused by electron- and light irradiation have been studied by high-resolution X-ray photoelectron spectroscopy. The mechanisms of the induced transformations are compared. It is shown that light irradiation causes redistribution of chemical bonds without change in chemical composition. The products of such lightinduced structural transformations were also identified by Raman spectroscopy in the volume of thin films. Electron irradiation changes chemical composition of the surface by creating an As-enriched layer due to the formation of As?O bonds. Anomalous increase of the ~10 eV band associated with non-bonding As 4s electrons was observed after light- and low dose e-beam irradiation. (en)
  • Metodou rentgenové fotoelektronové spektroskopie byly studovány změny elektronové struktury a chemického složení na povrchu čerstvě napařených vrstev o složení As35S65 indukované expozicí elektrony a svakem fotonů a porovnán mechanismus těchto změn.. (cs)
Title
  • Comparative study of electron- and photo-induced structural transformations on the surface of As35S65 amorphous thin films
  • Srovnávací studium strukturálních změn indukovaných na povrchu tenké amorfní vrstvy As35S65 expozicí svazkem elektronů a fotony (cs)
  • Comparative study of electron- and photo-induced structural transformations on the surface of As35S65 amorphous thin films (en)
skos:prefLabel
  • Comparative study of electron- and photo-induced structural transformations on the surface of As35S65 amorphous thin films
  • Srovnávací studium strukturálních změn indukovaných na povrchu tenké amorfní vrstvy As35S65 expozicí svazkem elektronů a fotony (cs)
  • Comparative study of electron- and photo-induced structural transformations on the surface of As35S65 amorphous thin films (en)
skos:notation
  • RIV/00216275:25310/08:00007924!RIV09-MSM-25310___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • Z(MSM0021627501)
http://linked.open...iv/cisloPeriodika
  • 21
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 360513
http://linked.open...ai/riv/idVysledku
  • RIV/00216275:25310/08:00007924
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • chalcogenide glasses; structural transformations; thin films (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • CH - Švýcarská konfederace
http://linked.open...ontrolniKodProRIV
  • [C88582E0B478]
http://linked.open...i/riv/nazevZdroje
  • Thin Solid Films
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 516
http://linked.open...iv/tvurceVysledku
  • Vlček, Miroslav
  • Jain, H.
  • Kovalskiy, A.
  • Neilson, J. R.
  • Miller, A. C.
  • Miller, F. C.
http://linked.open...n/vavai/riv/zamer
issn
  • 0040-6090
number of pages
http://localhost/t...ganizacniJednotka
  • 25310
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