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  • Strain gauges are broadly used in sensors that detect and measure force and force-related quantities, such as deflection, torque, acceleration, pressure, and vibration. The piezoresistor is a basic building block for strain sensors that often use multiple strain gauges (piezoresistors) in their construction. A strain gauge is usually exposed to a small mechanical deformation which results in a small change in gauge resistance proportional to the applied strain (force, or other strain related quantity). Nanocrystalline Diamond (NCD) is a very promising material for fabrication of high-temperature devices because of its unique mechanical and electrical properties.
  • Strain gauges are broadly used in sensors that detect and measure force and force-related quantities, such as deflection, torque, acceleration, pressure, and vibration. The piezoresistor is a basic building block for strain sensors that often use multiple strain gauges (piezoresistors) in their construction. A strain gauge is usually exposed to a small mechanical deformation which results in a small change in gauge resistance proportional to the applied strain (force, or other strain related quantity). Nanocrystalline Diamond (NCD) is a very promising material for fabrication of high-temperature devices because of its unique mechanical and electrical properties. (en)
Title
  • High-Temperature Strain-Gauges Based on Nanocrystalline Diamond Layers
  • High-Temperature Strain-Gauges Based on Nanocrystalline Diamond Layers (en)
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  • High-Temperature Strain-Gauges Based on Nanocrystalline Diamond Layers
  • High-Temperature Strain-Gauges Based on Nanocrystalline Diamond Layers (en)
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  • RIV/68407700:21230/09:00159502!RIV10-MSM-21230___
http://linked.open...avai/riv/aktivita
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  • P(GA102/09/1601), Z(MSM6840770012)
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
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  • 317186
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  • RIV/68407700:21230/09:00159502
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  • piezoresistivity; nanocrystalline diamond; strain sensor (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [EB27A759B4C7]
http://linked.open...v/mistoKonaniAkce
  • Brno
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  • Brno
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  • Electronic Devices and Systems, IMAPS CS International Conference 2009 Proceedings
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http://linked.open...UplatneniVysledku
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  • Bouřa, Adam
  • Husák, Miroslav
  • Kulha, Pavel
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http://linked.open...n/vavai/riv/zamer
number of pages
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  • Vysoké učení technické v Brně. Fakulta elektrotechniky a informatiky
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  • 978-80-214-3933-7
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  • 21230
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