About: Local photoconductivity of microcrystalline silicon thin films excited by 442 nm HeCd laser measured by conductive atomic force microscopy

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	Microcrystalline silicon (μc-Si:H) thin films were studied by photo-conductive atomic force microscopy (PC-AFM) under top side illumination by HeCd 442 nm laser and/or by scattered light of AFM detection diode. In order to make the top side illumination possible, so called “nose type cantilevers, with the tip at the end of cantilever, were used for local photo-current map measurements. Local current intensity under different illumination is discussed mainly from a point of view of the absorption depth of the used light. Diffusion length of charge carriers 300 nm was estimated from comparison of the current levels under different illumination. Microcrystalline silicon (μc-Si:H) thin films were studied by photo-conductive atomic force microscopy (PC-AFM) under top side illumination by HeCd 442 nm laser and/or by scattered light of AFM detection diode. In order to make the top side illumination possible, so called “nose type cantilevers, with the tip at the end of cantilever, were used for local photo-current map measurements. Local current intensity under different illumination is discussed mainly from a point of view of the absorption depth of the used light. Diffusion length of charge carriers 300 nm was estimated from comparison of the current levels under different illumination. (en)
Title	Local photoconductivity of microcrystalline silicon thin films excited by 442 nm HeCd laser measured by conductive atomic force microscopy Local photoconductivity of microcrystalline silicon thin films excited by 442 nm HeCd laser measured by conductive atomic force microscopy (en)
skos:prefLabel	Local photoconductivity of microcrystalline silicon thin films excited by 442 nm HeCd laser measured by conductive atomic force microscopy Local photoconductivity of microcrystalline silicon thin films excited by 442 nm HeCd laser measured by conductive atomic force microscopy (en)
skos:notation	RIV/68378271:_____/12:00386854!RIV13-AV0-68378271
http://linked.open...avai/predkladatel	Fyzikální ústav AV ČR, v.v.i.
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(KAN400100701), P(LC06040), P(MEB061012), Z(AV0Z10100521)
http://linked.open...iv/cisloPeriodika	17
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Fejfar, Antonín Ledinský, Martin Stuchlík, Jiří Vetushka, Aliaksi Kočka, Jan
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	147312
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/12:00386854
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	amorphous and nanocrystalline silicon films; atomic force microscopy (AFM); local photoconductivity (en)
http://linked.open.../riv/klicoveSlovo	atomic force microscopy (AFM) amorphous and nanocrystalline silicon films local photoconductivity
http://linked.open...odStatuVydavatele	NL - Nizozemsko
http://linked.open...ontrolniKodProRIV	[837162365CD8]
http://linked.open...i/riv/nazevZdroje	Journal of Non-Crystalline Solids
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	5 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	Study of nanostructured heterogeneous materials using scanning probe methods Functional hybrid nanosystems of semiconductors and metals with organic materials (FUNS) Structures for Nanophotonics and Nanoelectronics
http://linked.open...UplatneniVysledku	2012
http://linked.open...v/svazekPeriodika	358
http://linked.open...iv/tvurceVysledku	Ledinský, Martin Fejfar, Antonín Stuchlík, Jiří Kočka, Jan Vetushka, Aliaksi
http://linked.open...ain/vavai/riv/wos	000310394700037
http://linked.open...n/vavai/riv/zamer	Physics and technology of nanostructures, surfaces and thin films
issn	0022-3093
number of pages	5 (xsd:int)
http://bibframe.org/vocab/doi	10.1016/j.jnoncrysol.2012.01.015
is http://linked.open...avai/riv/vysledek of	Local photoconductivity of microcrystalline silicon thin films excited by 442 nm HeCd laser measured by conductive atomic force microscopy

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