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rdf:type
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Description
| - Real-time ion diagnostics have been performed by the use of various time-of-flight (TOF) detectors: ion collectors (ICs) with and without absorber thin films, new prototypes of single-crystal diamond and silicon carbide detectors, and an electrostatic ion mass spectrometer (IEA). In order to suppress the long photopeak induced by soft X-rays and to avoid the overlap with the signal from ultrafast particles, the ICs have been shielded with Al foil filters. The application of large-bandgap semiconductor detectors (>3 eV) ensured cutting of the plasma-emitted visible and soft-UV radiation and enhancing the sensitivity to the very fast proton/ion beams. Employing the IEA spectrometer, various ion species and charge states in the expanding laser-plasma have been determined.
- Real-time ion diagnostics have been performed by the use of various time-of-flight (TOF) detectors: ion collectors (ICs) with and without absorber thin films, new prototypes of single-crystal diamond and silicon carbide detectors, and an electrostatic ion mass spectrometer (IEA). In order to suppress the long photopeak induced by soft X-rays and to avoid the overlap with the signal from ultrafast particles, the ICs have been shielded with Al foil filters. The application of large-bandgap semiconductor detectors (>3 eV) ensured cutting of the plasma-emitted visible and soft-UV radiation and enhancing the sensitivity to the very fast proton/ion beams. Employing the IEA spectrometer, various ion species and charge states in the expanding laser-plasma have been determined. (en)
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Title
| - Full characterization of laser-accelerated ion beams using Faraday cup, silicon carbide, and single-crystal diamond detectors
- Full characterization of laser-accelerated ion beams using Faraday cup, silicon carbide, and single-crystal diamond detectors (en)
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skos:prefLabel
| - Full characterization of laser-accelerated ion beams using Faraday cup, silicon carbide, and single-crystal diamond detectors
- Full characterization of laser-accelerated ion beams using Faraday cup, silicon carbide, and single-crystal diamond detectors (en)
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skos:notation
| - RIV/68378271:_____/11:00364302!RIV12-AV0-68378271
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http://linked.open...avai/predkladatel
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(7E09092), P(GAP205/11/1165), Z(AV0Z10100523), Z(AV0Z20430508)
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/68378271:_____/11:00364302
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - aluminium; chemical sensors; diamond; electrostatics; iodine; ion beams; thin films; lasers; time of flight spectrometers (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
| - US - Spojené státy americké
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
| - Journal of Applied Physics
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
| - Krása, Josef
- Mocek, Tomáš
- Rus, Bedřich
- Giuffrida, L.
- Láska, Leoš
- Margarone, Daniele
- Musumeci, P.
- Nowak, T.
- Picciotto, A.
- Prokůpek, Jan
- Torrisi, L.
- Ullschmied, Jiří
- Velyhan, Andriy
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http://linked.open...ain/vavai/riv/wos
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http://linked.open...n/vavai/riv/zamer
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issn
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number of pages
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http://bibframe.org/vocab/doi
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is http://linked.open...avai/riv/vysledek
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