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Description
| - Starting with the demonstration of efficient photoluminescence of silicon nanocrystals, nanocrystalline silicon is ranked among the most studied semiconductor materials. Its main prospect is assigned to the possibility of constructing a silicon based laser, which could be easily integrated into present microelectronic chips. To attain higher optical gain it is necessary to investigate and identify processes in Si NCs. We investigated the processes extending time scales from hundreds of femtosecond to miliseconds, namely by up-conversion technique, by a streak camera and a PMT. We studied the processes in various Si NC systems, including also organically passivated NCs which allowed us to distinguish between intrinsic Si NC properties and effects of Si SiO2 interface. Time-resolved spectroscopy were extended by optical gain measurements and measurements of nonlinear properties by using two-photon absorption.
- Starting with the demonstration of efficient photoluminescence of silicon nanocrystals, nanocrystalline silicon is ranked among the most studied semiconductor materials. Its main prospect is assigned to the possibility of constructing a silicon based laser, which could be easily integrated into present microelectronic chips. To attain higher optical gain it is necessary to investigate and identify processes in Si NCs. We investigated the processes extending time scales from hundreds of femtosecond to miliseconds, namely by up-conversion technique, by a streak camera and a PMT. We studied the processes in various Si NC systems, including also organically passivated NCs which allowed us to distinguish between intrinsic Si NC properties and effects of Si SiO2 interface. Time-resolved spectroscopy were extended by optical gain measurements and measurements of nonlinear properties by using two-photon absorption. (en)
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Title
| - Nonlinear optical properties of silicon nanocrystals studied by ultrafast spectroscopy
- Nonlinear optical properties of silicon nanocrystals studied by ultrafast spectroscopy (en)
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skos:prefLabel
| - Nonlinear optical properties of silicon nanocrystals studied by ultrafast spectroscopy
- Nonlinear optical properties of silicon nanocrystals studied by ultrafast spectroscopy (en)
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skos:notation
| - RIV/68378271:_____/09:00331262!RIV10-MSM-68378271
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - P(GA202/07/0818), P(IAA101120804), P(LC510), Z(AV0Z10100521)
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/68378271:_____/09:00331262
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - silicon; nanocrystal; spectroscopy; recombination (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...ontrolniKodProRIV
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...vavai/riv/projekt
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http://linked.open...UplatneniVysledku
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http://linked.open...iv/tvurceVysledku
| - Malý, P.
- Dohnalová, Kateřina
- Cibulka, Ondřej
- Kůsová, Kateřina
- Pelant, Ivan
- Trojánek, F.
- Gilliot, P.
- Hönerlage, B.
- Oberlé, J.
- Žídek, Karel
- Crégut, O.
- Jonusauskas, G.
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http://linked.open...n/vavai/riv/zamer
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