About: Overlayer thickness determination by XPS using the multiline approach

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	We consider here a possibility of using more than two intensities for a given element, in the procedure of thickness determination. We consider here a possibility of using more than two intensities for a given element, in the procedure of thickness determination. (en) Ke stanovení tloušťek tenkých vrstev navrhujeme použití více než dvou linií pro daný prvek. (cs)
Title	Overlayer thickness determination by XPS using the multiline approach Overlayer thickness determination by XPS using the multiline approach (en) Určování tlouštěk tenkých vrstev z fotoemisních linií (cs)
skos:prefLabel	Overlayer thickness determination by XPS using the multiline approach Overlayer thickness determination by XPS using the multiline approach (en) Určování tlouštěk tenkých vrstev z fotoemisních linií (cs)
skos:notation	RIV/68378271:_____/08:00322013!RIV09-AV0-68378271
http://linked.open...avai/riv/aktivita	P Z
http://linked.open...avai/riv/aktivity	P(GA202/06/0459), Z(AV0Z10100521)
http://linked.open...iv/cisloPeriodika	3
http://linked.open...vai/riv/dodaniDat	2009
http://linked.open...aciTvurceVysledku	Zemek, Josef
http://linked.open.../riv/druhVysledku	J - Článek v odborném periodiku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Fyzikální ústav AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	385637
http://linked.open...ai/riv/idVysledku	RIV/68378271:_____/08:00322013
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	computer simulations; electron-solid interactions; Monte Carlo simulations; x-ray photoelectron spectroscopy (en)
http://linked.open.../riv/klicoveSlovo	computer simulations Monte Carlo simulations x-ray photoelectron spectroscopy electron-solid interactions
http://linked.open...odStatuVydavatele	GB - Spojené království Velké Británie a Severního Irska
http://linked.open...ontrolniKodProRIV	[D4F62B4D918A]
http://linked.open...i/riv/nazevZdroje	Surface and Interface Analysis
http://linked.open...in/vavai/riv/obor	BM
http://linked.open...ichTvurcuVysledku	1 (xsd:int)
http://linked.open...cetTvurcuVysledku	2 (xsd:int)
http://linked.open...vavai/riv/projekt	Electron interactions at unordered solid surfaces
http://linked.open...UplatneniVysledku	2008
http://linked.open...v/svazekPeriodika	41
http://linked.open...iv/tvurceVysledku	Zemek, Josef Jablonski, A.
http://linked.open...ain/vavai/riv/wos	000263750400008
http://linked.open...n/vavai/riv/zamer	Physics and technology of nanostructures, surfaces and thin films
issn	0142-2421
number of pages	12 (xsd:int)
is http://linked.open...avai/riv/vysledek of	Overlayer thickness determination by XPS using the multiline approach Overlayer thickness determination by XPS using the multiline approach

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