About: New detection systems of secondary and backscattered electrons for environmental scanning electron microscopes

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An Entity of Type : http://linked.opendata.cz/ontology/domain/vavai/Vysledek, within Data Space : linked.opendata.cz associated with source document(s)

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rdf:type	skos:Concept http://linked.opendata.cz/ontology/domain/vavai/Vysledek
Description	This article is focussed on describing the working principles of newly introduced systems for detecting secondary and backscattered electrons in high pressure conditions of a specimen chamber in environmental scanning electron microscopes. This article is focussed on describing the working principles of newly introduced systems for detecting secondary and backscattered electrons in high pressure conditions of a specimen chamber in environmental scanning electron microscopes. (en)
Title	New detection systems of secondary and backscattered electrons for environmental scanning electron microscopes New detection systems of secondary and backscattered electrons for environmental scanning electron microscopes (en)
skos:prefLabel	New detection systems of secondary and backscattered electrons for environmental scanning electron microscopes New detection systems of secondary and backscattered electrons for environmental scanning electron microscopes (en)
skos:notation	RIV/68081731:_____/12:00379919!RIV13-GA0-68081731
http://linked.open...avai/predkladatel	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...avai/riv/aktivita	I P
http://linked.open...avai/riv/aktivity	I, P(EE.2.3.20.0103), P(GAP102/10/1410)
http://linked.open...vai/riv/dodaniDat	2013
http://linked.open...aciTvurceVysledku	Neděla, Vilém Konvalina, Ivo
http://linked.open.../riv/druhVysledku	D - Článek ve sborníku
http://linked.open...iv/duvernostUdaju	S - Úplné a pravdivé údaje nepodléhající ochraně podle zvláštních právních předpisů
http://linked.open...titaPredkladatele	Ústav přístrojové techniky AV ČR, v. v. i.
http://linked.open...dnocenehoVysledku	153997
http://linked.open...ai/riv/idVysledku	RIV/68081731:_____/12:00379919
http://linked.open...riv/jazykVysledku	eng - angličtina
http://linked.open.../riv/klicovaSlova	environmental scanning electron microscope; detection systems; secondary electrons; backscattered electrons (en)
http://linked.open.../riv/klicoveSlovo	backscattered electrons detection systems environmental scanning electron microscope secondary electrons
http://linked.open...ontrolniKodProRIV	[323CFFBB37C7]
http://linked.open...v/mistoKonaniAkce	Perth
http://linked.open...i/riv/mistoVydani	Wembley
http://linked.open...i/riv/nazevZdroje	Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22
http://linked.open...in/vavai/riv/obor	JA
http://linked.open...ichTvurcuVysledku	2 (xsd:int)
http://linked.open...cetTvurcuVysledku	5 (xsd:int)
http://linked.open...vavai/riv/projekt	Support for human resources and transfer of knowledge in conditions of international cooperation of research teams The study of the influence of magnetic and electric fields for amplification of secondary electron signals detected by a novel detector in VP-SEM.
http://linked.open...UplatneniVysledku	2012
http://linked.open...iv/tvurceVysledku	Konvalina, Ivo Neděla, Vilém Zlámal, J. Jirák, J. Lencová, B.
http://linked.open...vavai/riv/typAkce	WRD - Světová
http://linked.open.../riv/zahajeniAkce	2012-02-05 (xsd:date)
number of pages	2 (xsd:int)
http://purl.org/ne...btex#hasPublisher	EECW Pty Ltd
https://schema.org/isbn	978-1-74052-245-8
is http://linked.open...avai/riv/vysledek of	New detection systems of secondary and backscattered electrons for environmental scanning electron microscopes

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