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rdf:type
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Description
| - In experimental thin film physics, there is a demand to characterize a growing thin film or a thin film as an experimental result. While methods for discontinuous, island-like thin films have been developed, there is a lack of results directly applicable to semicontinuous thin film description. In this contribution, a unique combination of image processing methods has been collected and further developed, which resulted in a novel set of semicontinuous thin film descriptors. In particular, the shape of the thin film contours and the thin film image intensity profiles have been analyzed in a multiscale manner. Descriptiveness of the proposed features is demonstrated on a few real experiment thin film photographs. This work has established a basis for further measurement, description, simulation or other processing in physics of semicontinuous thin films, using any direct imaging modality.
- In experimental thin film physics, there is a demand to characterize a growing thin film or a thin film as an experimental result. While methods for discontinuous, island-like thin films have been developed, there is a lack of results directly applicable to semicontinuous thin film description. In this contribution, a unique combination of image processing methods has been collected and further developed, which resulted in a novel set of semicontinuous thin film descriptors. In particular, the shape of the thin film contours and the thin film image intensity profiles have been analyzed in a multiscale manner. Descriptiveness of the proposed features is demonstrated on a few real experiment thin film photographs. This work has established a basis for further measurement, description, simulation or other processing in physics of semicontinuous thin films, using any direct imaging modality. (en)
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Title
| - Multiscale semicontinuous thin film descriptors
- Multiscale semicontinuous thin film descriptors (en)
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skos:prefLabel
| - Multiscale semicontinuous thin film descriptors
- Multiscale semicontinuous thin film descriptors (en)
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skos:notation
| - RIV/67985556:_____/04:00330314!RIV10-AV0-67985556
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http://linked.open...avai/riv/aktivita
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http://linked.open...avai/riv/aktivity
| - Z(AV0Z1075907), Z(MSM 113200002)
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http://linked.open...iv/cisloPeriodika
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http://linked.open...vai/riv/dodaniDat
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http://linked.open...aciTvurceVysledku
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http://linked.open.../riv/druhVysledku
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http://linked.open...iv/duvernostUdaju
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http://linked.open...titaPredkladatele
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http://linked.open...dnocenehoVysledku
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http://linked.open...ai/riv/idVysledku
| - RIV/67985556:_____/04:00330314
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http://linked.open...riv/jazykVysledku
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http://linked.open.../riv/klicovaSlova
| - semicontinuous thin films; wavelet transform; segmentation; skeleton; graph representation (en)
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http://linked.open.../riv/klicoveSlovo
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http://linked.open...odStatuVydavatele
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http://linked.open...ontrolniKodProRIV
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http://linked.open...i/riv/nazevZdroje
| - Central European Journal of Physics
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http://linked.open...in/vavai/riv/obor
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http://linked.open...ichTvurcuVysledku
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http://linked.open...cetTvurcuVysledku
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http://linked.open...UplatneniVysledku
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http://linked.open...v/svazekPeriodika
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http://linked.open...iv/tvurceVysledku
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http://linked.open...n/vavai/riv/zamer
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issn
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number of pages
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