About: Reactive magnetron sputtering of Si-C-N films with controlled mechanical and optical properties.     Goto   Sponge   Distinct   Permalink

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  • Si-C-N films were deposited on p-type Si(I 0 0) substrates by dc magnetron co-sputtering of silicon and carbon using a single sputter target with variable Si/C area ratios in nitrogen-argon mixtures. The film characteristics were controlled by the silicon fraction (5-80%) in the erosion target area for a 50% N-2+50% Ar gas mixture and by the argon concentration (0-75%) in the gas mixture at a fixed 40% silicon fraction in the erosion target area. The total pressure and the discharge current on the magnetron target were held constant at p = 0.5 Pa and I-m = I A, the substrate temperature was adjusted at T-s = 600 degreesC by an ohmic heater and the r.f. induced negative substrate bias voltage, U-b was -500 V The films, typically 1.0-1.5 mum thick, were found to be amorphous with a very smooth surface (R(a)less than or equal to0.8 nm) and good adhesion to substrates. It was shown that not only the composition of the C-Si target but also the nitrogen-argon gas mixture composition makes it possible to con
  • Si-C-N films were deposited on p-type Si(I 0 0) substrates by dc magnetron co-sputtering of silicon and carbon using a single sputter target with variable Si/C area ratios in nitrogen-argon mixtures. The film characteristics were controlled by the silicon fraction (5-80%) in the erosion target area for a 50% N-2+50% Ar gas mixture and by the argon concentration (0-75%) in the gas mixture at a fixed 40% silicon fraction in the erosion target area. The total pressure and the discharge current on the magnetron target were held constant at p = 0.5 Pa and I-m = I A, the substrate temperature was adjusted at T-s = 600 degreesC by an ohmic heater and the r.f. induced negative substrate bias voltage, U-b was -500 V The films, typically 1.0-1.5 mum thick, were found to be amorphous with a very smooth surface (R(a)less than or equal to0.8 nm) and good adhesion to substrates. It was shown that not only the composition of the C-Si target but also the nitrogen-argon gas mixture composition makes it possible to con (en)
Title
  • Reactive magnetron sputtering of Si-C-N films with controlled mechanical and optical properties.
  • Reactive magnetron sputtering of Si-C-N films with controlled mechanical and optical properties. (en)
skos:prefLabel
  • Reactive magnetron sputtering of Si-C-N films with controlled mechanical and optical properties.
  • Reactive magnetron sputtering of Si-C-N films with controlled mechanical and optical properties. (en)
skos:notation
  • RIV/61389005:_____/03:49033147!RIV/2004/AV0/A49004/N
http://linked.open.../vavai/riv/strany
  • 1287;1294
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • P(ME 203), P(OC 527.90), Z(AV0Z1010914), Z(AV0Z1048901), Z(MSM 235200002)
http://linked.open...iv/cisloPeriodika
  • 8
http://linked.open...vai/riv/dodaniDat
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  • 624636
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  • RIV/61389005:_____/03:49033147
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  • silicon-carbon-nitride films; magnetron co-sputtering (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...odStatuVydavatele
  • CH - Švýcarská konfederace
http://linked.open...ontrolniKodProRIV
  • [541D4DA58C86]
http://linked.open...i/riv/nazevZdroje
  • DIAMOND AND RELATED MATERIALS
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
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http://linked.open...vavai/riv/projekt
http://linked.open...UplatneniVysledku
http://linked.open...v/svazekPeriodika
  • 12
http://linked.open...iv/tvurceVysledku
  • Kormunda, M.
  • Peřina, Vratislav
  • Zemek, Josef
  • Vlček, J.
  • Čížek, J.
  • Soukup, Z.
http://linked.open...n/vavai/riv/zamer
issn
  • 0925-9635
number of pages
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