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  • Je podán přehled rozličných původních aplikací disperzní spektrální interferometrie v bílém světle využívající spektrometr s nízkým rozlišením a založených na určení ekvalizace vlnové délky. Za prvé, měříme disperzi diferenciálního grupového indexu lomu a chromatickou disperzi vzorku známé tloušťky, a určujeme ekvalizační vlnovou délku jako funkci posunu interferenčního zrcadla. Za druhé je použita technika nevyžadující aplikaci zjištění fáze pro měření vzdálenosti a posuvu zrcadel, je-li známa disperze ve dvousvazkovém interferometru. Za třetí je použita technika disperzivní spektrální interferometrie pro lehce disperzivní interferometr, včetně efektu tenkých filmů. (cs)
  • Various original applications of dispersive white-light spectral interferometry employing a low-resolution spectrometer and based on the equalization wavelength determinations are reviewed. First, the differential group refractive index dispersion or the chromatic dispersion of a dispersive sample of known thickness is measured determining the equalization wavelength as a function of the displacement of the interferometer mirror. Similarly, the effective thickness of a dispersive sample is determined measuring the mirror displacement as a function of the group refractive index of material. Second, the technique, which needs no phase retrieving procedure to be applied, is used to measure mirror distances and displacements when dispersion in a two-beam interferometer is known. Third, a technique of dispersive spectral interferometry is used for a slightly dispersive interferometer including the effect of thin films...
  • Various original applications of dispersive white-light spectral interferometry employing a low-resolution spectrometer and based on the equalization wavelength determinations are reviewed. First, the differential group refractive index dispersion or the chromatic dispersion of a dispersive sample of known thickness is measured determining the equalization wavelength as a function of the displacement of the interferometer mirror. Similarly, the effective thickness of a dispersive sample is determined measuring the mirror displacement as a function of the group refractive index of material. Second, the technique, which needs no phase retrieving procedure to be applied, is used to measure mirror distances and displacements when dispersion in a two-beam interferometer is known. Third, a technique of dispersive spectral interferometry is used for a slightly dispersive interferometer including the effect of thin films... (en)
Title
  • Applications of dispersive white-light spectral interferometry in optics - art. no. 615803
  • Applications of dispersive white-light spectral interferometry in optics - art. no. 615803 (en)
  • Aplikace disperzní spektrální interferometrie v bílém světle v optice – článek č. 615803 (cs)
skos:prefLabel
  • Applications of dispersive white-light spectral interferometry in optics - art. no. 615803
  • Applications of dispersive white-light spectral interferometry in optics - art. no. 615803 (en)
  • Aplikace disperzní spektrální interferometrie v bílém světle v optice – článek č. 615803 (cs)
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  • RIV/47813059:19240/06:#0002013!RIV09-MSM-19240___
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  • RIV/47813059:19240/06:#0002013
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  • EQUALIZATION WAVELENGTH DETERMINATION, MEASURE DISTANCES, FUSED-SILICA, MICHELSON INTERFEROMETER, FIBEROPTIC SPECTROMETER, 2-BEAM INTERFERENCE, REFRACTIVE-INDEX, DISPLACEMENTS, DOMAIN (en)
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  • Warsaw, POLAND
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  • BELLINGHAM, USA
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  • PROGRESS IN BIOMEDICAL OPTICS AND IMAGING
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  • Hlubina, Petr
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  • 000236540100003
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  • 1605-7422
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  • SPIE-INT SOC OPTICAL ENGINEERING
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  • 0-8194-6210-1
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  • 19240
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