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Description
  • Dvoupaprsková interference na výstupu lehce disperzního Michelsonova interferometru je použita k měření fázového spektra transparentních filmů skrze širokou škálu vlnových délek. Použitím Fourierovy transformace v procesu zaznamenaného spektrálního interferogramu byly získány nejednoznačné fázové funkce spektrálních proužků. (cs)
  • Two-beam spectral interference at the output of a slightly dispersive Michelson interferometer is used to measure the phase spectra of transparent thin films over a wide range of wavelengths. First, using a Fourier transform method in processing of the recorded spectral interferograms the ambiguous spectral fringe phase function is obtained...
  • Two-beam spectral interference at the output of a slightly dispersive Michelson interferometer is used to measure the phase spectra of transparent thin films over a wide range of wavelengths. First, using a Fourier transform method in processing of the recorded spectral interferograms the ambiguous spectral fringe phase function is obtained... (en)
Title
  • Measurement of the phase spectra of transparent thin films using white-light interferometry
  • Measurement of the phase spectra of transparent thin films using white-light interferometry (en)
  • Měření fázového spektra transparentních tenkých filmů s použitím interferometrie bílého světla (cs)
skos:prefLabel
  • Measurement of the phase spectra of transparent thin films using white-light interferometry
  • Measurement of the phase spectra of transparent thin films using white-light interferometry (en)
  • Měření fázového spektra transparentních tenkých filmů s použitím interferometrie bílého světla (cs)
skos:notation
  • RIV/47813059:19240/03:#0002019!RIV09-MSM-19240___
http://linked.open...avai/riv/aktivita
http://linked.open...avai/riv/aktivity
  • S
http://linked.open...vai/riv/dodaniDat
http://linked.open...aciTvurceVysledku
http://linked.open.../riv/druhVysledku
http://linked.open...iv/duvernostUdaju
http://linked.open...titaPredkladatele
http://linked.open...dnocenehoVysledku
  • 614604
http://linked.open...ai/riv/idVysledku
  • RIV/47813059:19240/03:#0002019
http://linked.open...riv/jazykVysledku
http://linked.open.../riv/klicovaSlova
  • white-light source, spectral interference, Michelson interferometer, Fourier transform method, optical element, thickness, low refractive index dispersion, thin films, phase spectrum (en)
http://linked.open.../riv/klicoveSlovo
http://linked.open...ontrolniKodProRIV
  • [48A529537DF2]
http://linked.open...v/mistoKonaniAkce
  • Ostrava, CZECH REPUBLIC
http://linked.open...i/riv/mistoVydani
  • USA
http://linked.open...i/riv/nazevZdroje
  • MICROWAVE AND OPTICAL TECHNOLOGY 2003: PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
http://linked.open...in/vavai/riv/obor
http://linked.open...ichTvurcuVysledku
http://linked.open...cetTvurcuVysledku
http://linked.open...UplatneniVysledku
http://linked.open...iv/tvurceVysledku
  • Hlubina, Petr
http://linked.open...vavai/riv/typAkce
http://linked.open...ain/vavai/riv/wos
  • 000221853300024
http://linked.open.../riv/zahajeniAkce
issn
  • 0277-786X
number of pages
http://purl.org/ne...btex#hasPublisher
  • SPIE-INT SOC OPTICAL ENGINEERING, 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA
https://schema.org/isbn
  • 0-8194-5368-4
http://localhost/t...ganizacniJednotka
  • 19240
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