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  • The noise spectroscopy and I-V characteristic non-linearity measurement were applied as diagnostic tools in order to characterize the volume and contact quality of positive temperature coefficient (PTC) chip sensors and to predict the mode of possible contact failure. Correctly made and stable contacts are crucial for proper sensing. I-V characteristics and time dependences of resistance were measured for studied sensors and, besides the samples with stable resistance value, the spike type resistance fluctuation was observed for some samples. These spikes often disappear after about 24 hours of voltage application. Linear I-V characteristics were measured for the samples with stable resistance. The resistance fluctuation of burst noise type was observed for some samples showing I-V characteristic dependent of the electric field orientation. We have found that the thermistors with high quality contacts has linear I-V characteristic, the noise spectral density is 1/f type and the third harmonic index is
  • The noise spectroscopy and I-V characteristic non-linearity measurement were applied as diagnostic tools in order to characterize the volume and contact quality of positive temperature coefficient (PTC) chip sensors and to predict the mode of possible contact failure. Correctly made and stable contacts are crucial for proper sensing. I-V characteristics and time dependences of resistance were measured for studied sensors and, besides the samples with stable resistance value, the spike type resistance fluctuation was observed for some samples. These spikes often disappear after about 24 hours of voltage application. Linear I-V characteristics were measured for the samples with stable resistance. The resistance fluctuation of burst noise type was observed for some samples showing I-V characteristic dependent of the electric field orientation. We have found that the thermistors with high quality contacts has linear I-V characteristic, the noise spectral density is 1/f type and the third harmonic index is (en)
Title
  • Analysis of noise and non-linearity of I-V characteristics of positive temperature coefficient chip thermistors
  • Analysis of noise and non-linearity of I-V characteristics of positive temperature coefficient chip thermistors (en)
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  • Analysis of noise and non-linearity of I-V characteristics of positive temperature coefficient chip thermistors
  • Analysis of noise and non-linearity of I-V characteristics of positive temperature coefficient chip thermistors (en)
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  • RIV/00216305:26220/13:PU106761!RIV14-GA0-26220___
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  • P(ED1.1.00/02.0068), P(GAP102/11/0995)
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  • 60594
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  • RIV/00216305:26220/13:PU106761
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  • PTC chip sensors, noise spectroscopy, I-V characteristic non-linearity, quality evaluation (en)
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  • GB - Spojené království Velké Británie a Severního Irska
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  • [E478954309CC]
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  • XX
http://linked.open...iv/tvurceVysledku
  • Grmela, Lubomír
  • Majzner, Jiří
  • Sedlák, Petr
  • Sedláková, Vlasta
  • Šikula, Josef
  • Sita, Zdeněk
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  • 0860-8229
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  • 26220
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